Morphology and microstructure evolution of multilayer Au/Cr/Si thin films subject to annealing

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • David Miller
  • Cari Herrmann
  • Hans Maier
  • Steve George
  • Conrad Stoldt
  • Ken Gall

Externe Organisationen

  • University of Colorado Boulder
  • Universität Paderborn
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Details

OriginalspracheEnglisch
Titel des SammelwerksStability of Thin Films and Nanostructures
Herausgeber (Verlag)Materials Research Society
Seiten131-136
Seitenumfang6
ISBN (Print)1558998063, 9781558998063
PublikationsstatusVeröffentlicht - 2004
Extern publiziertJa
Veranstaltung2004 MRS Fall Meeting - Boston, MA, USA / Vereinigte Staaten
Dauer: 29 Nov. 20043 Dez. 2004

Publikationsreihe

NameMaterials Research Society Symposium Proceedings
Band854
ISSN (Print)0272-9172

Abstract

Au/Cr/Si microcantilevers were studied in their as-deposited condition and annealed state, with emphasis on a thermal treatment of 225 °C for 24 hours. Change in beam curvature was monitored during isothermal hold as a function of time. Secondary grain growth was observed in the gold, which contained non-uniformly distributed twins and dislocation defects, Diffusional transport of the chromium layer was observed during annealing. Nodules arranged in the "rolling hill" topography were observed at the free surface, both before and after annealing. Nanometer thick coatings of alumina grown by atomic layer deposition improved the uniformity of both microstructure evolution and curvature evolution during high-temperature annealing.

ASJC Scopus Sachgebiete

Zitieren

Morphology and microstructure evolution of multilayer Au/Cr/Si thin films subject to annealing. / Miller, David; Herrmann, Cari; Maier, Hans et al.
Stability of Thin Films and Nanostructures. Materials Research Society, 2004. S. 131-136 (Materials Research Society Symposium Proceedings; Band 854).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Miller, D, Herrmann, C, Maier, H, George, S, Stoldt, C & Gall, K 2004, Morphology and microstructure evolution of multilayer Au/Cr/Si thin films subject to annealing. in Stability of Thin Films and Nanostructures. Materials Research Society Symposium Proceedings, Bd. 854, Materials Research Society, S. 131-136, 2004 MRS Fall Meeting, Boston, MA, USA / Vereinigte Staaten, 29 Nov. 2004. https://doi.org/10.1557/proc-854-u7.5
Miller, D., Herrmann, C., Maier, H., George, S., Stoldt, C., & Gall, K. (2004). Morphology and microstructure evolution of multilayer Au/Cr/Si thin films subject to annealing. In Stability of Thin Films and Nanostructures (S. 131-136). (Materials Research Society Symposium Proceedings; Band 854). Materials Research Society. https://doi.org/10.1557/proc-854-u7.5
Miller D, Herrmann C, Maier H, George S, Stoldt C, Gall K. Morphology and microstructure evolution of multilayer Au/Cr/Si thin films subject to annealing. in Stability of Thin Films and Nanostructures. Materials Research Society. 2004. S. 131-136. (Materials Research Society Symposium Proceedings). doi: 10.1557/proc-854-u7.5
Miller, David ; Herrmann, Cari ; Maier, Hans et al. / Morphology and microstructure evolution of multilayer Au/Cr/Si thin films subject to annealing. Stability of Thin Films and Nanostructures. Materials Research Society, 2004. S. 131-136 (Materials Research Society Symposium Proceedings).
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AU - Stoldt, Conrad

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