Modern topics in standardized laser-induced damage threshold measurements

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • Kai Starke
  • Holger Blaschke
  • Marco Jupé
  • Marc Lappschies
  • Detlev Ristau

Externe Organisationen

  • Laser Zentrum Hannover e.V. (LZH)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des SammelwerksOptical Fabrication, Testing, and Metrology II
Untertitel13 - 15 September 2005, Jena, Germany
ErscheinungsortBellingham
Herausgeber (Verlag)SPIE
ISBN (Print)0-8194-5983-6
PublikationsstatusVeröffentlicht - 19 Okt. 2005
Extern publiziertJa
VeranstaltungOptical Fabrication, Testing, and Metrology II - Jena, Deutschland
Dauer: 13 Sept. 200515 Sept. 2005

Publikationsreihe

NameProceedings of SPIE - The International Society for Optical Engineering
Herausgeber (Verlag)SPIE
Band5965
ISSN (Print)0277-786X

Abstract

Although the measurement of the laser-induced damage threshold is a field of permanent research effort since the late 1960s, the optimization of the damage handling capability is still a key issue for the development of high performance laser systems. In conjunction with the ever increasing demand for lasers with high average power, energy, extreme wavelengths or short pulses, the resistance to laser damage has to be optimized with a special regard to the different damage mechanisms. Therefore, a report of the current status of the laser-induced damage threshold is given for the most interesting components and laser systems applied in science and industry. Further, several results of recently performed damage investigations in the NIR spectral range and for ultra short pulses are presented in this paper. The reliability of damage threshold measurements is crucially depending on the chosen test parameters. The importance of the different parameter values were investigated carefully during several Round-Robin experiments. These investigations can be regarded as the basis of the standardization process leading to the International Standard ISO 11254. In this paper, selected results of the comparative campaigns in damage testing are described, especially in the field of ns and fs pulses.

ASJC Scopus Sachgebiete

Zitieren

Modern topics in standardized laser-induced damage threshold measurements. / Starke, Kai; Blaschke, Holger; Jupé, Marco et al.
Optical Fabrication, Testing, and Metrology II: 13 - 15 September 2005, Jena, Germany. Bellingham: SPIE, 2005. (Proceedings of SPIE - The International Society for Optical Engineering; Band 5965).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Starke, K, Blaschke, H, Jupé, M, Lappschies, M & Ristau, D 2005, Modern topics in standardized laser-induced damage threshold measurements. in Optical Fabrication, Testing, and Metrology II: 13 - 15 September 2005, Jena, Germany. Proceedings of SPIE - The International Society for Optical Engineering, Bd. 5965, SPIE, Bellingham, Optical Fabrication, Testing, and Metrology II, Jena, Deutschland, 13 Sept. 2005. https://doi.org/10.1117/12.629055
Starke, K., Blaschke, H., Jupé, M., Lappschies, M., & Ristau, D. (2005). Modern topics in standardized laser-induced damage threshold measurements. In Optical Fabrication, Testing, and Metrology II: 13 - 15 September 2005, Jena, Germany (Proceedings of SPIE - The International Society for Optical Engineering; Band 5965). SPIE. https://doi.org/10.1117/12.629055
Starke K, Blaschke H, Jupé M, Lappschies M, Ristau D. Modern topics in standardized laser-induced damage threshold measurements. in Optical Fabrication, Testing, and Metrology II: 13 - 15 September 2005, Jena, Germany. Bellingham: SPIE. 2005. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.629055
Starke, Kai ; Blaschke, Holger ; Jupé, Marco et al. / Modern topics in standardized laser-induced damage threshold measurements. Optical Fabrication, Testing, and Metrology II: 13 - 15 September 2005, Jena, Germany. Bellingham : SPIE, 2005. (Proceedings of SPIE - The International Society for Optical Engineering).
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