Details
Originalsprache | Englisch |
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Titel des Sammelwerks | Optical Fabrication, Testing, and Metrology II |
Untertitel | 13 - 15 September 2005, Jena, Germany |
Erscheinungsort | Bellingham |
Herausgeber (Verlag) | SPIE |
ISBN (Print) | 0-8194-5983-6 |
Publikationsstatus | Veröffentlicht - 19 Okt. 2005 |
Extern publiziert | Ja |
Veranstaltung | Optical Fabrication, Testing, and Metrology II - Jena, Deutschland Dauer: 13 Sept. 2005 → 15 Sept. 2005 |
Publikationsreihe
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Herausgeber (Verlag) | SPIE |
Band | 5965 |
ISSN (Print) | 0277-786X |
Abstract
Although the measurement of the laser-induced damage threshold is a field of permanent research effort since the late 1960s, the optimization of the damage handling capability is still a key issue for the development of high performance laser systems. In conjunction with the ever increasing demand for lasers with high average power, energy, extreme wavelengths or short pulses, the resistance to laser damage has to be optimized with a special regard to the different damage mechanisms. Therefore, a report of the current status of the laser-induced damage threshold is given for the most interesting components and laser systems applied in science and industry. Further, several results of recently performed damage investigations in the NIR spectral range and for ultra short pulses are presented in this paper. The reliability of damage threshold measurements is crucially depending on the chosen test parameters. The importance of the different parameter values were investigated carefully during several Round-Robin experiments. These investigations can be regarded as the basis of the standardization process leading to the International Standard ISO 11254. In this paper, selected results of the comparative campaigns in damage testing are described, especially in the field of ns and fs pulses.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Informatik (insg.)
- Angewandte Informatik
- Mathematik (insg.)
- Angewandte Mathematik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- RIS
Optical Fabrication, Testing, and Metrology II: 13 - 15 September 2005, Jena, Germany. Bellingham: SPIE, 2005. (Proceedings of SPIE - The International Society for Optical Engineering; Band 5965).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Modern topics in standardized laser-induced damage threshold measurements
AU - Starke, Kai
AU - Blaschke, Holger
AU - Jupé, Marco
AU - Lappschies, Marc
AU - Ristau, Detlev
PY - 2005/10/19
Y1 - 2005/10/19
N2 - Although the measurement of the laser-induced damage threshold is a field of permanent research effort since the late 1960s, the optimization of the damage handling capability is still a key issue for the development of high performance laser systems. In conjunction with the ever increasing demand for lasers with high average power, energy, extreme wavelengths or short pulses, the resistance to laser damage has to be optimized with a special regard to the different damage mechanisms. Therefore, a report of the current status of the laser-induced damage threshold is given for the most interesting components and laser systems applied in science and industry. Further, several results of recently performed damage investigations in the NIR spectral range and for ultra short pulses are presented in this paper. The reliability of damage threshold measurements is crucially depending on the chosen test parameters. The importance of the different parameter values were investigated carefully during several Round-Robin experiments. These investigations can be regarded as the basis of the standardization process leading to the International Standard ISO 11254. In this paper, selected results of the comparative campaigns in damage testing are described, especially in the field of ns and fs pulses.
AB - Although the measurement of the laser-induced damage threshold is a field of permanent research effort since the late 1960s, the optimization of the damage handling capability is still a key issue for the development of high performance laser systems. In conjunction with the ever increasing demand for lasers with high average power, energy, extreme wavelengths or short pulses, the resistance to laser damage has to be optimized with a special regard to the different damage mechanisms. Therefore, a report of the current status of the laser-induced damage threshold is given for the most interesting components and laser systems applied in science and industry. Further, several results of recently performed damage investigations in the NIR spectral range and for ultra short pulses are presented in this paper. The reliability of damage threshold measurements is crucially depending on the chosen test parameters. The importance of the different parameter values were investigated carefully during several Round-Robin experiments. These investigations can be regarded as the basis of the standardization process leading to the International Standard ISO 11254. In this paper, selected results of the comparative campaigns in damage testing are described, especially in the field of ns and fs pulses.
KW - fs-pulses
KW - ISO 11254
KW - Laser-induced damage threshold
KW - Round-Robin
KW - Standardized measurement
UR - http://www.scopus.com/inward/record.url?scp=33244491683&partnerID=8YFLogxK
U2 - 10.1117/12.629055
DO - 10.1117/12.629055
M3 - Conference contribution
AN - SCOPUS:33244491683
SN - 0-8194-5983-6
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Fabrication, Testing, and Metrology II
PB - SPIE
CY - Bellingham
T2 - Optical Fabrication, Testing, and Metrology II
Y2 - 13 September 2005 through 15 September 2005
ER -