Modeling of Al2O3 thin film growth in modern ion coating processes

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • Marcus Turowski
  • Henrik Ehlers
  • K. Heinrich
  • Detlev Ristau

Externe Organisationen

  • Laser Zentrum Hannover e.V. (LZH)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des SammelwerksOptical Interference Coatings
UntertitelOIC 2013
Herausgeber (Verlag)OSA - The Optical Society
ISBN (Print)9781557529701
PublikationsstatusVeröffentlicht - 2013
VeranstaltungOptical Interference Coatings, OIC 2013 - Whistler, Kanada
Dauer: 16 Juni 201321 Juni 2013

Publikationsreihe

NameOptics InfoBase Conference Papers
ISSN (elektronisch)2162-2701

Abstract

Classical molecular dynamics techniques are used for modeling Al2O3 thin film growth according to modern ion coating processes. Results for surface roughness and film density dependent on deposition energy are presented.

ASJC Scopus Sachgebiete

Zitieren

Modeling of Al2O3 thin film growth in modern ion coating processes. / Turowski, Marcus; Ehlers, Henrik; Heinrich, K. et al.
Optical Interference Coatings: OIC 2013. OSA - The Optical Society, 2013. (Optics InfoBase Conference Papers).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Turowski, M, Ehlers, H, Heinrich, K & Ristau, D 2013, Modeling of Al2O3 thin film growth in modern ion coating processes. in Optical Interference Coatings: OIC 2013. Optics InfoBase Conference Papers, OSA - The Optical Society, Optical Interference Coatings, OIC 2013, Whistler, Kanada, 16 Juni 2013. https://doi.org/10.1364/oic.2013.ma.8
Turowski, M., Ehlers, H., Heinrich, K., & Ristau, D. (2013). Modeling of Al2O3 thin film growth in modern ion coating processes. In Optical Interference Coatings: OIC 2013 (Optics InfoBase Conference Papers). OSA - The Optical Society. https://doi.org/10.1364/oic.2013.ma.8
Turowski M, Ehlers H, Heinrich K, Ristau D. Modeling of Al2O3 thin film growth in modern ion coating processes. in Optical Interference Coatings: OIC 2013. OSA - The Optical Society. 2013. (Optics InfoBase Conference Papers). doi: 10.1364/oic.2013.ma.8
Turowski, Marcus ; Ehlers, Henrik ; Heinrich, K. et al. / Modeling of Al2O3 thin film growth in modern ion coating processes. Optical Interference Coatings: OIC 2013. OSA - The Optical Society, 2013. (Optics InfoBase Conference Papers).
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