Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | Modeling Aspects in Optical Metrology VII |
| Herausgeber/-innen | Bernd Bodermann, Karsten Frenner |
| Herausgeber (Verlag) | SPIE |
| ISBN (elektronisch) | 9781510627932 |
| Publikationsstatus | Veröffentlicht - 21 Juni 2019 |
| Extern publiziert | Ja |
| Veranstaltung | Modeling Aspects in Optical Metrology VII 2019 - Munich, Deutschland Dauer: 24 Juni 2019 → 26 Juni 2019 |
Publikationsreihe
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Band | 11057 |
| ISSN (Print) | 0277-786X |
| ISSN (elektronisch) | 1996-756X |
Abstract
Collinear photothermal deflection spectroscopy (PDS) is a widely used method for the spatially resolved determination of the optical attenuation coefficient. In this work we rigorously model the signal contributions in PDS on semiconductors below the band gap energy. The dependencies of the PDS signal on selected experimental parameters (pump beam intensity, crossing angle, chopper frequency and distance from the pump beam focus) are computed and compared with previous calculation results that are based on simplified assumptions. We find that for high pump beam intensities and sample materials with high two photon absorption coefficients beside the mirage effect nonlinear absorption mechanisms have a strong impact on the signal. Furthermore, we show that angular deflection effects can significantly enhance the PDS signal. For example, the conical refractive index field due to the pump beam divergence leads to an angular deflection at readout points outside the pump beam focus. Considering these additional signal contributions is crucial to determine proper absorption properties.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Informatik (insg.)
- Angewandte Informatik
- Mathematik (insg.)
- Angewandte Mathematik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- BibTex
- RIS
Modeling Aspects in Optical Metrology VII. Hrsg. / Bernd Bodermann; Karsten Frenner. SPIE, 2019. 110570B (Proceedings of SPIE - The International Society for Optical Engineering; Band 11057).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Modeling aspects for high precision absorption measurements
AU - DIckmann, Walter
AU - DIckmann, Johannes
AU - Bruns, Florian F.
AU - Kroker, Stefanie
N1 - Funding Information: W.D. gratefully acknowledges support by the Braunschweig International Graduate School of Metrology B-IGSM and the DFG research training group GrK1952/1 "Metrology for Complex Nanosystems". F.F.B. acknowledges support by the cluster of Excellence "QuantumFrontiers" ExC 2123.
PY - 2019/6/21
Y1 - 2019/6/21
N2 - Collinear photothermal deflection spectroscopy (PDS) is a widely used method for the spatially resolved determination of the optical attenuation coefficient. In this work we rigorously model the signal contributions in PDS on semiconductors below the band gap energy. The dependencies of the PDS signal on selected experimental parameters (pump beam intensity, crossing angle, chopper frequency and distance from the pump beam focus) are computed and compared with previous calculation results that are based on simplified assumptions. We find that for high pump beam intensities and sample materials with high two photon absorption coefficients beside the mirage effect nonlinear absorption mechanisms have a strong impact on the signal. Furthermore, we show that angular deflection effects can significantly enhance the PDS signal. For example, the conical refractive index field due to the pump beam divergence leads to an angular deflection at readout points outside the pump beam focus. Considering these additional signal contributions is crucial to determine proper absorption properties.
AB - Collinear photothermal deflection spectroscopy (PDS) is a widely used method for the spatially resolved determination of the optical attenuation coefficient. In this work we rigorously model the signal contributions in PDS on semiconductors below the band gap energy. The dependencies of the PDS signal on selected experimental parameters (pump beam intensity, crossing angle, chopper frequency and distance from the pump beam focus) are computed and compared with previous calculation results that are based on simplified assumptions. We find that for high pump beam intensities and sample materials with high two photon absorption coefficients beside the mirage effect nonlinear absorption mechanisms have a strong impact on the signal. Furthermore, we show that angular deflection effects can significantly enhance the PDS signal. For example, the conical refractive index field due to the pump beam divergence leads to an angular deflection at readout points outside the pump beam focus. Considering these additional signal contributions is crucial to determine proper absorption properties.
KW - Absorption
KW - Angular effects
KW - Mirage effect
KW - Photothermal deflection spectroscopy
KW - Pump probe
KW - Ray tracing
KW - Signal modeling
KW - Two-photon absorption
UR - http://www.scopus.com/inward/record.url?scp=85072553168&partnerID=8YFLogxK
U2 - 10.1117/12.2525690
DO - 10.1117/12.2525690
M3 - Conference contribution
AN - SCOPUS:85072553168
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Modeling Aspects in Optical Metrology VII
A2 - Bodermann, Bernd
A2 - Frenner, Karsten
PB - SPIE
T2 - Modeling Aspects in Optical Metrology VII 2019
Y2 - 24 June 2019 through 26 June 2019
ER -