Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 2008 IEEE Sensors |
| Seiten | 180-183 |
| Seitenumfang | 4 |
| ISBN (elektronisch) | 9781424425815 |
| Publikationsstatus | Veröffentlicht - 16 Dez. 2008 |
| Extern publiziert | Ja |
| Veranstaltung | IEEE Sensors 2008 - Lecce, Italien Dauer: 26 Okt. 2008 → 29 Okt. 2009 https://ieee-sensors.org/event/ieee-sensors-2008/ |
Publikationsreihe
| Name | Proceedings of IEEE Sensors |
|---|---|
| ISSN (Print) | 1930-0395 |
| ISSN (elektronisch) | 2168-9229 |
Abstract
A numerical model has been used to study the effect of various design parameters on the resolution of our miniaturized ion mobility spectrometer (IMS). This multiphysics model is based on a finite element approach and gives a detailed insight into the convection and migration of gaseous ions in the spectrometer. It can be also applied to other aspiration condenser type IMS. As reported earlier, physical ion-ion and ion-molecule interactions are considered to achieve an adequate accuracy of the simulations. With good conformity between simulations and measurements, both resolution and simplicity of our design could be significantly improved. The optimized IMS can be used in cost and sizelimited applications where chemical substances have to be identified at low ppb-level concentrations within seconds.
ASJC Scopus Sachgebiete
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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2008 IEEE Sensors. 2008. S. 180-183 (Proceedings of IEEE Sensors).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Model-based resolution enhancement of a miniaturized ion mobility spectrometer
AU - Barth, Sebastian
AU - Baether, Wolfgang
AU - Zimmermann, Stefan
PY - 2008/12/16
Y1 - 2008/12/16
N2 - A numerical model has been used to study the effect of various design parameters on the resolution of our miniaturized ion mobility spectrometer (IMS). This multiphysics model is based on a finite element approach and gives a detailed insight into the convection and migration of gaseous ions in the spectrometer. It can be also applied to other aspiration condenser type IMS. As reported earlier, physical ion-ion and ion-molecule interactions are considered to achieve an adequate accuracy of the simulations. With good conformity between simulations and measurements, both resolution and simplicity of our design could be significantly improved. The optimized IMS can be used in cost and sizelimited applications where chemical substances have to be identified at low ppb-level concentrations within seconds.
AB - A numerical model has been used to study the effect of various design parameters on the resolution of our miniaturized ion mobility spectrometer (IMS). This multiphysics model is based on a finite element approach and gives a detailed insight into the convection and migration of gaseous ions in the spectrometer. It can be also applied to other aspiration condenser type IMS. As reported earlier, physical ion-ion and ion-molecule interactions are considered to achieve an adequate accuracy of the simulations. With good conformity between simulations and measurements, both resolution and simplicity of our design could be significantly improved. The optimized IMS can be used in cost and sizelimited applications where chemical substances have to be identified at low ppb-level concentrations within seconds.
UR - http://www.scopus.com/inward/record.url?scp=67649999856&partnerID=8YFLogxK
U2 - 10.1109/ICSENS.2008.4716413
DO - 10.1109/ICSENS.2008.4716413
M3 - Conference contribution
AN - SCOPUS:67649999856
SN - 9781424425808
T3 - Proceedings of IEEE Sensors
SP - 180
EP - 183
BT - 2008 IEEE Sensors
T2 - IEEE Sensors 2008
Y2 - 26 October 2008 through 29 October 2009
ER -