Methods of parameter variations

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandBeitrag in Buch/SammelwerkForschungPeer-Review

Autorschaft

  • Christoph Knoth
  • Ulf Schlichtmann
  • Bing Li
  • Min Zhang
  • Markus Olbrich
  • Emrah Acar
  • Uwe Eichler
  • Joachim Haase
  • André Lange
  • Michael Pronath

Externe Organisationen

  • Technische Universität München (TUM)
  • IBM
  • Fraunhofer-Institut für Integrierte Schaltungen (IIS)
  • MunEDA GmbH
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des SammelwerksProcess Variations and Probabilistic Integrated Circuit Design
Seiten91-179
Seitenumfang89
Band9781441966216
ISBN (elektronisch)9781441966216
PublikationsstatusVeröffentlicht - 1 Sept. 2012

Abstract

Chapter 4 presents various dedicated methods that support variability handling in the design process. Using these methods, the designer can analyze the effect of variations on his design and identify possible improvements.

ASJC Scopus Sachgebiete

Zitieren

Methods of parameter variations. / Knoth, Christoph; Schlichtmann, Ulf; Li, Bing et al.
Process Variations and Probabilistic Integrated Circuit Design. Band 9781441966216 2012. S. 91-179.

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandBeitrag in Buch/SammelwerkForschungPeer-Review

Knoth, C, Schlichtmann, U, Li, B, Zhang, M, Olbrich, M, Acar, E, Eichler, U, Haase, J, Lange, A & Pronath, M 2012, Methods of parameter variations. in Process Variations and Probabilistic Integrated Circuit Design. Bd. 9781441966216, S. 91-179. https://doi.org/10.1007/978-1-4419-6621-6_4
Knoth, C., Schlichtmann, U., Li, B., Zhang, M., Olbrich, M., Acar, E., Eichler, U., Haase, J., Lange, A., & Pronath, M. (2012). Methods of parameter variations. In Process Variations and Probabilistic Integrated Circuit Design (Band 9781441966216, S. 91-179) https://doi.org/10.1007/978-1-4419-6621-6_4
Knoth C, Schlichtmann U, Li B, Zhang M, Olbrich M, Acar E et al. Methods of parameter variations. in Process Variations and Probabilistic Integrated Circuit Design. Band 9781441966216. 2012. S. 91-179 doi: 10.1007/978-1-4419-6621-6_4
Knoth, Christoph ; Schlichtmann, Ulf ; Li, Bing et al. / Methods of parameter variations. Process Variations and Probabilistic Integrated Circuit Design. Band 9781441966216 2012. S. 91-179
Download
@inbook{ce5a6cc4864a46b7ad5205796b406a56,
title = "Methods of parameter variations",
abstract = "Chapter 4 presents various dedicated methods that support variability handling in the design process. Using these methods, the designer can analyze the effect of variations on his design and identify possible improvements.",
author = "Christoph Knoth and Ulf Schlichtmann and Bing Li and Min Zhang and Markus Olbrich and Emrah Acar and Uwe Eichler and Joachim Haase and Andr{\'e} Lange and Michael Pronath",
note = "Publisher Copyright: {\textcopyright} 2012 Springer Science+Business Media, LLC. All rights reserved. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.",
year = "2012",
month = sep,
day = "1",
doi = "10.1007/978-1-4419-6621-6_4",
language = "English",
isbn = "144196620X",
volume = "9781441966216",
pages = "91--179",
booktitle = "Process Variations and Probabilistic Integrated Circuit Design",

}

Download

TY - CHAP

T1 - Methods of parameter variations

AU - Knoth, Christoph

AU - Schlichtmann, Ulf

AU - Li, Bing

AU - Zhang, Min

AU - Olbrich, Markus

AU - Acar, Emrah

AU - Eichler, Uwe

AU - Haase, Joachim

AU - Lange, André

AU - Pronath, Michael

N1 - Publisher Copyright: © 2012 Springer Science+Business Media, LLC. All rights reserved. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.

PY - 2012/9/1

Y1 - 2012/9/1

N2 - Chapter 4 presents various dedicated methods that support variability handling in the design process. Using these methods, the designer can analyze the effect of variations on his design and identify possible improvements.

AB - Chapter 4 presents various dedicated methods that support variability handling in the design process. Using these methods, the designer can analyze the effect of variations on his design and identify possible improvements.

UR - http://www.scopus.com/inward/record.url?scp=84949180073&partnerID=8YFLogxK

U2 - 10.1007/978-1-4419-6621-6_4

DO - 10.1007/978-1-4419-6621-6_4

M3 - Contribution to book/anthology

AN - SCOPUS:84949180073

SN - 144196620X

SN - 9781441966209

VL - 9781441966216

SP - 91

EP - 179

BT - Process Variations and Probabilistic Integrated Circuit Design

ER -