Details
Originalsprache | Englisch |
---|---|
Titel des Sammelwerks | Process Variations and Probabilistic Integrated Circuit Design |
Seiten | 91-179 |
Seitenumfang | 89 |
Band | 9781441966216 |
ISBN (elektronisch) | 9781441966216 |
Publikationsstatus | Veröffentlicht - 1 Sept. 2012 |
Abstract
Chapter 4 presents various dedicated methods that support variability handling in the design process. Using these methods, the designer can analyze the effect of variations on his design and identify possible improvements.
ASJC Scopus Sachgebiete
- Ingenieurwesen (insg.)
- Allgemeiner Maschinenbau
Zitieren
- Standard
- Harvard
- Apa
- Vancouver
- BibTex
- RIS
Process Variations and Probabilistic Integrated Circuit Design. Band 9781441966216 2012. S. 91-179.
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Beitrag in Buch/Sammelwerk › Forschung › Peer-Review
}
TY - CHAP
T1 - Methods of parameter variations
AU - Knoth, Christoph
AU - Schlichtmann, Ulf
AU - Li, Bing
AU - Zhang, Min
AU - Olbrich, Markus
AU - Acar, Emrah
AU - Eichler, Uwe
AU - Haase, Joachim
AU - Lange, André
AU - Pronath, Michael
N1 - Publisher Copyright: © 2012 Springer Science+Business Media, LLC. All rights reserved. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2012/9/1
Y1 - 2012/9/1
N2 - Chapter 4 presents various dedicated methods that support variability handling in the design process. Using these methods, the designer can analyze the effect of variations on his design and identify possible improvements.
AB - Chapter 4 presents various dedicated methods that support variability handling in the design process. Using these methods, the designer can analyze the effect of variations on his design and identify possible improvements.
UR - http://www.scopus.com/inward/record.url?scp=84949180073&partnerID=8YFLogxK
U2 - 10.1007/978-1-4419-6621-6_4
DO - 10.1007/978-1-4419-6621-6_4
M3 - Contribution to book/anthology
AN - SCOPUS:84949180073
SN - 144196620X
SN - 9781441966209
VL - 9781441966216
SP - 91
EP - 179
BT - Process Variations and Probabilistic Integrated Circuit Design
ER -