Details
| Originalsprache | Englisch |
|---|---|
| Seitenumfang | 6 |
| Publikationsstatus | Veröffentlicht - 2016 |
| Veranstaltung | 19th World Conference on Non-Destructive Testing WCNDT - München, München, Deutschland Dauer: 13 Juni 2016 → 17 Juni 2016 |
Konferenz
| Konferenz | 19th World Conference on Non-Destructive Testing WCNDT |
|---|---|
| Kurztitel | WCNDT |
| Land/Gebiet | Deutschland |
| Ort | München |
| Zeitraum | 13 Juni 2016 → 17 Juni 2016 |
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Material Characterization of Thin Coatings Using High Frequency Eddy Current Technology. / Bruchwald, Oliver; Nicolaus, Martin; Frackowiak, Wojciech et al.
2016. Beitrag in 19th World Conference on Non-Destructive Testing WCNDT, München, Deutschland.
2016. Beitrag in 19th World Conference on Non-Destructive Testing WCNDT, München, Deutschland.
Publikation: Konferenzbeitrag › Paper › Forschung
Bruchwald, O, Nicolaus, M, Frackowiak, W, Möhwald, K, Reimche, W & Maier, HJ 2016, 'Material Characterization of Thin Coatings Using High Frequency Eddy Current Technology', Beitrag in 19th World Conference on Non-Destructive Testing WCNDT, München, Deutschland, 13 Juni 2016 - 17 Juni 2016.
Bruchwald, O., Nicolaus, M., Frackowiak, W., Möhwald, K., Reimche, W., & Maier, H. J. (2016). Material Characterization of Thin Coatings Using High Frequency Eddy Current Technology. Beitrag in 19th World Conference on Non-Destructive Testing WCNDT, München, Deutschland.
Bruchwald O, Nicolaus M, Frackowiak W, Möhwald K, Reimche W, Maier HJ. Material Characterization of Thin Coatings Using High Frequency Eddy Current Technology. 2016. Beitrag in 19th World Conference on Non-Destructive Testing WCNDT, München, Deutschland.
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@conference{bbaa6b9d46d44c1bb810b0b3b1b096c2,
title = "Material Characterization of Thin Coatings Using High Frequency Eddy Current Technology",
author = "Oliver Bruchwald and Martin Nicolaus and Wojciech Frackowiak and Kai M{\"o}hwald and Wilfried Reimche and Maier, {Hans J{\"u}rgen}",
year = "2016",
language = "English",
note = "19th World Conference on Non-Destructive Testing WCNDT, WCNDT ; Conference date: 13-06-2016 Through 17-06-2016",
}
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TY - CONF
T1 - Material Characterization of Thin Coatings Using High Frequency Eddy Current Technology
AU - Bruchwald, Oliver
AU - Nicolaus, Martin
AU - Frackowiak, Wojciech
AU - Möhwald, Kai
AU - Reimche, Wilfried
AU - Maier, Hans Jürgen
PY - 2016
Y1 - 2016
M3 - Paper
T2 - 19th World Conference on Non-Destructive Testing WCNDT
Y2 - 13 June 2016 through 17 June 2016
ER -