Marker-based registration error estimation in see-through AR applications

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • Lukas Jütte
  • Alexander Poschke
  • Ludger Overmeyer

Externe Organisationen

  • Institut für integrierte Produktion Hannover (IPH) gGmbH
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des SammelwerksNovel Optical Systems, Methods, and Applications XXVI
Herausgeber/-innenCornelius F. Hahlweg, Joseph R. Mulley
Herausgeber (Verlag)SPIE
ISBN (elektronisch)9781510665446
PublikationsstatusVeröffentlicht - 2 Okt. 2023
VeranstaltungNovel Optical Systems, Methods, and Applications XXVI 2023 - San Diego, USA / Vereinigte Staaten
Dauer: 22 Aug. 202323 Aug. 2023

Publikationsreihe

NameProceedings of SPIE - The International Society for Optical Engineering
Band12665
ISSN (Print)0277-786X
ISSN (elektronisch)1996-756X

Abstract

The precise overlay in see-through AR applications and the development of methods to calculate the registration error for such applications using an AR head-mounted display (HMD) present significant challenges. This difficulty arises primarily due to the absence of ground truth data (GTD) as the scene is partially hidden by view restrictions. Traditional approaches may require expensive setups, like cameras or laser scanners, to capture the hidden area and generate GTD. We propose an approach to calculate the registration error by using a marker-based pose estimation method. We use synthetic data to show the suitability of our method. The synthetic data is created in Unity, where we replicated a see-through application. Therefore, we employ image augmentation technologies for simulating a real see-through forklift application. The utilization of the simulation environment enables the generation of GT). This data forms the basis for evaluating the accuracy of our proposed method. Our primary contributions include a simulated see-through AR application in Unity, a labeled, application-specific synthetic dataset, and a validated method for determining the 3D registration error in world units (mm). This work demonstrates the suitability of the development of a marker-based registration error method to determine a 3D registration error in AR HMD see-through applications, providing an alternative to traditional, more costly approaches.

ASJC Scopus Sachgebiete

Zitieren

Marker-based registration error estimation in see-through AR applications. / Jütte, Lukas; Poschke, Alexander; Overmeyer, Ludger.
Novel Optical Systems, Methods, and Applications XXVI. Hrsg. / Cornelius F. Hahlweg; Joseph R. Mulley. SPIE, 2023. 126650F (Proceedings of SPIE - The International Society for Optical Engineering; Band 12665).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Jütte, L, Poschke, A & Overmeyer, L 2023, Marker-based registration error estimation in see-through AR applications. in CF Hahlweg & JR Mulley (Hrsg.), Novel Optical Systems, Methods, and Applications XXVI., 126650F, Proceedings of SPIE - The International Society for Optical Engineering, Bd. 12665, SPIE, Novel Optical Systems, Methods, and Applications XXVI 2023, San Diego, USA / Vereinigte Staaten, 22 Aug. 2023. https://doi.org/10.1117/12.2676355
Jütte, L., Poschke, A., & Overmeyer, L. (2023). Marker-based registration error estimation in see-through AR applications. In C. F. Hahlweg, & J. R. Mulley (Hrsg.), Novel Optical Systems, Methods, and Applications XXVI Artikel 126650F (Proceedings of SPIE - The International Society for Optical Engineering; Band 12665). SPIE. https://doi.org/10.1117/12.2676355
Jütte L, Poschke A, Overmeyer L. Marker-based registration error estimation in see-through AR applications. in Hahlweg CF, Mulley JR, Hrsg., Novel Optical Systems, Methods, and Applications XXVI. SPIE. 2023. 126650F. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2676355
Jütte, Lukas ; Poschke, Alexander ; Overmeyer, Ludger. / Marker-based registration error estimation in see-through AR applications. Novel Optical Systems, Methods, and Applications XXVI. Hrsg. / Cornelius F. Hahlweg ; Joseph R. Mulley. SPIE, 2023. (Proceedings of SPIE - The International Society for Optical Engineering).
Download
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