Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 47th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials |
| Untertitel | 2015 |
| Herausgeber (Verlag) | SPIE |
| ISBN (elektronisch) | 9781628418323 |
| Publikationsstatus | Veröffentlicht - 23 Nov. 2015 |
| Extern publiziert | Ja |
| Veranstaltung | 47th Annual Laser Damage Symposium - Laser-Induced Damage in Optical Materials: 2015 - Boulder, USA / Vereinigte Staaten Dauer: 27 Sept. 2015 → 30 Sept. 2015 |
Publikationsreihe
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Band | 9632 |
| ISSN (Print) | 0277-786X |
| ISSN (elektronisch) | 1996-756X |
Abstract
As a consequence of the statistical nature of laser-induced damage threshold measurements in the nanosecond regime, the evaluation method plays a vital role. Within the test procedure outlined in the corresponding ISO standard, several steps of data reduction are required, and the resulting damage probability distribution as a function of laser fluence needs to be fitted either based on an empirical regression function or described by models for the respective damage mechanism.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Informatik (insg.)
- Angewandte Informatik
- Mathematik (insg.)
- Angewandte Mathematik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- BibTex
- RIS
47th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2015. SPIE, 2015. 96321J (Proceedings of SPIE - The International Society for Optical Engineering; Band 9632).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Lowering evaluation uncertainties in laser-induced damage testing
AU - Jensen, Lars O.
AU - Mrohs, Marius
AU - Gyamfi, Mark
AU - Madebach, Heinrich
AU - Ristau, Detlev
N1 - Funding information: The authors would like to acknowledge Stefan Schrameyer and Jens Vogel for their contribution to this field. In addition, the support of the German Ministry of Education and Research (BMBF) is acknowledged within the frame of the project UltraLIFE under Contract No. FKZ:13N11558.
PY - 2015/11/23
Y1 - 2015/11/23
N2 - As a consequence of the statistical nature of laser-induced damage threshold measurements in the nanosecond regime, the evaluation method plays a vital role. Within the test procedure outlined in the corresponding ISO standard, several steps of data reduction are required, and the resulting damage probability distribution as a function of laser fluence needs to be fitted either based on an empirical regression function or described by models for the respective damage mechanism.
AB - As a consequence of the statistical nature of laser-induced damage threshold measurements in the nanosecond regime, the evaluation method plays a vital role. Within the test procedure outlined in the corresponding ISO standard, several steps of data reduction are required, and the resulting damage probability distribution as a function of laser fluence needs to be fitted either based on an empirical regression function or described by models for the respective damage mechanism.
KW - ISO 21254
KW - Laser-induced damage testing
KW - reduced testing error
UR - http://www.scopus.com/inward/record.url?scp=84964966010&partnerID=8YFLogxK
U2 - 10.1117/12.2194944
DO - 10.1117/12.2194944
M3 - Conference contribution
AN - SCOPUS:84964966010
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - 47th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials
PB - SPIE
T2 - 47th Annual Laser Damage Symposium - Laser-Induced Damage in Optical Materials: 2015
Y2 - 27 September 2015 through 30 September 2015
ER -