Details
| Originalsprache | Englisch |
|---|---|
| Qualifikation | Doctor rerum naturalium |
| Gradverleihende Hochschule | |
| Betreut von |
|
| Datum der Verleihung des Grades | 13 März 2020 |
| Erscheinungsort | Hannover |
| Publikationsstatus | Veröffentlicht - 2020 |
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Light and elevated Temperature Induced Degradation (LeTID) of the Carrier Lifetime in Multicrystalline Silicon. / Bredemeier, Dennis.
Hannover, 2020. 119 S.
Hannover, 2020. 119 S.
Publikation: Qualifikations-/Studienabschlussarbeit › Dissertation
Bredemeier, D 2020, 'Light and elevated Temperature Induced Degradation (LeTID) of the Carrier Lifetime in Multicrystalline Silicon', Doctor rerum naturalium, Gottfried Wilhelm Leibniz Universität Hannover, Hannover. https://doi.org/10.15488/9814
Bredemeier, D. (2020). Light and elevated Temperature Induced Degradation (LeTID) of the Carrier Lifetime in Multicrystalline Silicon. [Dissertation, Gottfried Wilhelm Leibniz Universität Hannover]. https://doi.org/10.15488/9814
Bredemeier D. Light and elevated Temperature Induced Degradation (LeTID) of the Carrier Lifetime in Multicrystalline Silicon. Hannover, 2020. 119 S. doi: 10.15488/9814
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Download
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