Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | Laser-induced damage in optical materials |
| Untertitel | 1999 : 4 - 7 October 1999, Boulder, Colorado ; proceedings |
| Erscheinungsort | Bellingham |
| Herausgeber (Verlag) | SPIE |
| Seiten | 408-417 |
| Seitenumfang | 10 |
| ISBN (Print) | 0-8194-3508-2 |
| Publikationsstatus | Veröffentlicht - 2000 |
| Extern publiziert | Ja |
| Veranstaltung | 31st Annual Boulder Damage Symposium: 'Laser-Induced Damage in Optical Materials 1999' - Boulder, CO, USA Dauer: 4 Okt. 1999 → 7 Okt. 1999 |
Publikationsreihe
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Herausgeber (Verlag) | SPIE |
| Band | 3902 |
| ISSN (Print) | 0277-786X |
Abstract
During the last few years enormous technical progress has been achieved in the development of ultrashort pulse lasers. The new generation of these laser systems are near the threshold to innovative applications in industrial environments for precision material processing. As a consequence, an increasing demand for optical components with high laser damage resistance and extended lifetime can be noticed. In order to investigate the damage threshold and lifetime, the existing multiple-pulse laser-induced damage measurement facility at the Laser Zentrum Hannover has been adapted for the ultrashort pulse regime. During our measurements, the most important substrate materials and selected model layer systems were investigated, and the influence of optimized coating processes was studied. The results indicate a distinct reduction of the damage threshold with the exposed pulse number.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Informatik (insg.)
- Angewandte Informatik
- Mathematik (insg.)
- Angewandte Mathematik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- RIS
Laser-induced damage in optical materials: 1999 : 4 - 7 October 1999, Boulder, Colorado ; proceedings. Bellingham: SPIE, 2000. S. 408-417 (Proceedings of SPIE - The International Society for Optical Engineering; Band 3902).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Laser-induced damage threshold of optical components for ultrashort pulse laser systems
AU - Starke, Kai
AU - Gross, Tobias
AU - Ristau, Detlev
PY - 2000
Y1 - 2000
N2 - During the last few years enormous technical progress has been achieved in the development of ultrashort pulse lasers. The new generation of these laser systems are near the threshold to innovative applications in industrial environments for precision material processing. As a consequence, an increasing demand for optical components with high laser damage resistance and extended lifetime can be noticed. In order to investigate the damage threshold and lifetime, the existing multiple-pulse laser-induced damage measurement facility at the Laser Zentrum Hannover has been adapted for the ultrashort pulse regime. During our measurements, the most important substrate materials and selected model layer systems were investigated, and the influence of optimized coating processes was studied. The results indicate a distinct reduction of the damage threshold with the exposed pulse number.
AB - During the last few years enormous technical progress has been achieved in the development of ultrashort pulse lasers. The new generation of these laser systems are near the threshold to innovative applications in industrial environments for precision material processing. As a consequence, an increasing demand for optical components with high laser damage resistance and extended lifetime can be noticed. In order to investigate the damage threshold and lifetime, the existing multiple-pulse laser-induced damage measurement facility at the Laser Zentrum Hannover has been adapted for the ultrashort pulse regime. During our measurements, the most important substrate materials and selected model layer systems were investigated, and the influence of optimized coating processes was studied. The results indicate a distinct reduction of the damage threshold with the exposed pulse number.
UR - http://www.scopus.com/inward/record.url?scp=0033892252&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:0033892252
SN - 0-8194-3508-2
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 408
EP - 417
BT - Laser-induced damage in optical materials
PB - SPIE
CY - Bellingham
T2 - 31st Annual Boulder Damage Symposium: 'Laser-Induced Damage in Optical Materials 1999'
Y2 - 4 October 1999 through 7 October 1999
ER -