Laser-dilatometer calibration using a single-crystal silicon sample

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • Ines Hamann
  • Josep Sanjuan
  • Ruven Spannagel
  • Martin Gohlke
  • Gudrun Wanner
  • Sönke Schuster
  • Felipe Guzman
  • Claus Braxmaier

Organisationseinheiten

Externe Organisationen

  • Universität Bremen
  • Deutsches Zentrum für Luft- und Raumfahrt e.V. (DLR)
  • Max-Planck-Institut für Gravitationsphysik (Albert-Einstein-Institut)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Seiten (von - bis)18-29
Seitenumfang12
FachzeitschriftInternational Journal of Optomechatronics
Jahrgang13
Ausgabenummer1
PublikationsstatusElektronisch veröffentlicht (E-Pub) - 16 Apr. 2019

Abstract

Marginal changes in geometrical dimensions due to temperature changes affect the performance of optical instruments. Highly dimensionally stable materials can minimize these effects since they offer low coefficients of thermal expansion (CTE). Our dilatometer, based on heterodyne interferometry, is able to determine the CTE in 10-8 K-1 range. Here, we present the improved interferometer performance using angular measurements via differential wavefront sensing to correct for tilt-to-length coupling. The setup was tested by measuring the CTE of a single-crystal silicon at 285 K. Results are in good agreement with the reported values and show a bias of less than 1%.

ASJC Scopus Sachgebiete

Zitieren

Laser-dilatometer calibration using a single-crystal silicon sample. / Hamann, Ines; Sanjuan, Josep; Spannagel, Ruven et al.
in: International Journal of Optomechatronics, Jahrgang 13, Nr. 1, 16.04.2019, S. 18-29.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Hamann, I, Sanjuan, J, Spannagel, R, Gohlke, M, Wanner, G, Schuster, S, Guzman, F & Braxmaier, C 2019, 'Laser-dilatometer calibration using a single-crystal silicon sample', International Journal of Optomechatronics, Jg. 13, Nr. 1, S. 18-29. https://doi.org/10.1080/15599612.2019.1587117, https://doi.org/10.15488/11173
Hamann, I., Sanjuan, J., Spannagel, R., Gohlke, M., Wanner, G., Schuster, S., Guzman, F., & Braxmaier, C. (2019). Laser-dilatometer calibration using a single-crystal silicon sample. International Journal of Optomechatronics, 13(1), 18-29. Vorabveröffentlichung online. https://doi.org/10.1080/15599612.2019.1587117, https://doi.org/10.15488/11173
Hamann I, Sanjuan J, Spannagel R, Gohlke M, Wanner G, Schuster S et al. Laser-dilatometer calibration using a single-crystal silicon sample. International Journal of Optomechatronics. 2019 Apr 16;13(1):18-29. Epub 2019 Apr 16. doi: 10.1080/15599612.2019.1587117, 10.15488/11173
Hamann, Ines ; Sanjuan, Josep ; Spannagel, Ruven et al. / Laser-dilatometer calibration using a single-crystal silicon sample. in: International Journal of Optomechatronics. 2019 ; Jahrgang 13, Nr. 1. S. 18-29.
Download
@article{c51921f5195947468a03ac23b93aa698,
title = "Laser-dilatometer calibration using a single-crystal silicon sample",
abstract = "Marginal changes in geometrical dimensions due to temperature changes affect the performance of optical instruments. Highly dimensionally stable materials can minimize these effects since they offer low coefficients of thermal expansion (CTE). Our dilatometer, based on heterodyne interferometry, is able to determine the CTE in 10-8 K-1 range. Here, we present the improved interferometer performance using angular measurements via differential wavefront sensing to correct for tilt-to-length coupling. The setup was tested by measuring the CTE of a single-crystal silicon at 285 K. Results are in good agreement with the reported values and show a bias of less than 1%.",
keywords = "differential wavefront sensing, Dilatometry, silicon, simulation",
author = "Ines Hamann and Josep Sanjuan and Ruven Spannagel and Martin Gohlke and Gudrun Wanner and S{\"o}nke Schuster and Felipe Guzman and Claus Braxmaier",
note = "Funding information: For the TTL analyses in Section 3 and IfoCAD scientific development, we acknowledge support from the German Research Foundation DFG within SFB 1128 geo-Q (project A05).",
year = "2019",
month = apr,
day = "16",
doi = "10.1080/15599612.2019.1587117",
language = "English",
volume = "13",
pages = "18--29",
journal = "International Journal of Optomechatronics",
issn = "1559-9612",
publisher = "Taylor and Francis Ltd.",
number = "1",

}

Download

TY - JOUR

T1 - Laser-dilatometer calibration using a single-crystal silicon sample

AU - Hamann, Ines

AU - Sanjuan, Josep

AU - Spannagel, Ruven

AU - Gohlke, Martin

AU - Wanner, Gudrun

AU - Schuster, Sönke

AU - Guzman, Felipe

AU - Braxmaier, Claus

N1 - Funding information: For the TTL analyses in Section 3 and IfoCAD scientific development, we acknowledge support from the German Research Foundation DFG within SFB 1128 geo-Q (project A05).

PY - 2019/4/16

Y1 - 2019/4/16

N2 - Marginal changes in geometrical dimensions due to temperature changes affect the performance of optical instruments. Highly dimensionally stable materials can minimize these effects since they offer low coefficients of thermal expansion (CTE). Our dilatometer, based on heterodyne interferometry, is able to determine the CTE in 10-8 K-1 range. Here, we present the improved interferometer performance using angular measurements via differential wavefront sensing to correct for tilt-to-length coupling. The setup was tested by measuring the CTE of a single-crystal silicon at 285 K. Results are in good agreement with the reported values and show a bias of less than 1%.

AB - Marginal changes in geometrical dimensions due to temperature changes affect the performance of optical instruments. Highly dimensionally stable materials can minimize these effects since they offer low coefficients of thermal expansion (CTE). Our dilatometer, based on heterodyne interferometry, is able to determine the CTE in 10-8 K-1 range. Here, we present the improved interferometer performance using angular measurements via differential wavefront sensing to correct for tilt-to-length coupling. The setup was tested by measuring the CTE of a single-crystal silicon at 285 K. Results are in good agreement with the reported values and show a bias of less than 1%.

KW - differential wavefront sensing

KW - Dilatometry

KW - silicon

KW - simulation

UR - http://www.scopus.com/inward/record.url?scp=85064576258&partnerID=8YFLogxK

U2 - 10.1080/15599612.2019.1587117

DO - 10.1080/15599612.2019.1587117

M3 - Article

AN - SCOPUS:85064576258

VL - 13

SP - 18

EP - 29

JO - International Journal of Optomechatronics

JF - International Journal of Optomechatronics

SN - 1559-9612

IS - 1

ER -