Laser treatment of the heterolayers "GeO2:Ge-QDs"

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • E. B. Gorokhov
  • V. A. Volodin
  • A. I. Kuznetsov
  • B. N. Chichkov
  • K. N. Astankova
  • I. A. Azarov

Externe Organisationen

  • RAS - Institute of Semiconductor Physics, Siberian Branch
  • Novosibirsk State University
  • Laser Zentrum Hannover e.V. (LZH)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des SammelwerksLAT 2010
UntertitelInternational Conference on Lasers, Applications, and Technologies
PublikationsstatusVeröffentlicht - 7 Feb. 2011
Extern publiziertJa
VeranstaltungLAT 2010: International Conference on Lasers, Applications, and Technologies - Kazan, Russland
Dauer: 23 Aug. 201026 Aug. 2010

Publikationsreihe

NameProceedings of SPIE - The International Society for Optical Engineering
Band7994
ISSN (Print)0277-786X

Abstract

Treatments by femtosecond Ti-sapphire laser (wavelength is 800 nm, pulse duration is <30 fs) and nanosecond KrF excimer laser (wavelength is 248 nm, pulse duration is 25 ns) were performed to study the impact of laser fluence, pulse duration and energy of photons on the process of chemical and structural reconstructions in GeOx and GeO2:Ge heterolayers. The solid GeOx films are metastable and decompose into two phases - Ge and GeO2. Nanosecond KrF laser irradiation produces significant shrinkage of GeOx films and GeO2:Ge heterolayers caped by thin SiNxOy or SiO2 films. Pulse annealing by both types of lasers stimulate as the process of nanoclusters forming and crystallization of initial amorphous Ge-nanoclusters in the GeO2 matrix. The possibility to use the solid germanium monoxide (GeO(s)) and GeO2:Ge heterolayers (without cap layers) as nano-resist in laser nanolithography was demonstrated. The new nanostructured material was formed - the layers of nanofoam GeO2 which can be obtained only with application of femtosecond laser pulse treatments.

ASJC Scopus Sachgebiete

Zitieren

Laser treatment of the heterolayers "GeO2:Ge-QDs". / Gorokhov, E. B.; Volodin, V. A.; Kuznetsov, A. I. et al.
LAT 2010: International Conference on Lasers, Applications, and Technologies. 2011. 79940W (Proceedings of SPIE - The International Society for Optical Engineering; Band 7994).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Gorokhov, EB, Volodin, VA, Kuznetsov, AI, Chichkov, BN, Astankova, KN & Azarov, IA 2011, Laser treatment of the heterolayers "GeO2:Ge-QDs". in LAT 2010: International Conference on Lasers, Applications, and Technologies., 79940W, Proceedings of SPIE - The International Society for Optical Engineering, Bd. 7994, LAT 2010: International Conference on Lasers, Applications, and Technologies, Kazan, Russland, 23 Aug. 2010. https://doi.org/10.1117/12.882043
Gorokhov, E. B., Volodin, V. A., Kuznetsov, A. I., Chichkov, B. N., Astankova, K. N., & Azarov, I. A. (2011). Laser treatment of the heterolayers "GeO2:Ge-QDs". In LAT 2010: International Conference on Lasers, Applications, and Technologies Artikel 79940W (Proceedings of SPIE - The International Society for Optical Engineering; Band 7994). https://doi.org/10.1117/12.882043
Gorokhov EB, Volodin VA, Kuznetsov AI, Chichkov BN, Astankova KN, Azarov IA. Laser treatment of the heterolayers "GeO2:Ge-QDs". in LAT 2010: International Conference on Lasers, Applications, and Technologies. 2011. 79940W. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.882043
Gorokhov, E. B. ; Volodin, V. A. ; Kuznetsov, A. I. et al. / Laser treatment of the heterolayers "GeO2:Ge-QDs". LAT 2010: International Conference on Lasers, Applications, and Technologies. 2011. (Proceedings of SPIE - The International Society for Optical Engineering).
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@inproceedings{41d64b7ae9f84063a07ecb84c5024b22,
title = "Laser treatment of the heterolayers {"}GeO2:Ge-QDs{"}",
abstract = "Treatments by femtosecond Ti-sapphire laser (wavelength is 800 nm, pulse duration is <30 fs) and nanosecond KrF excimer laser (wavelength is 248 nm, pulse duration is 25 ns) were performed to study the impact of laser fluence, pulse duration and energy of photons on the process of chemical and structural reconstructions in GeOx and GeO2:Ge heterolayers. The solid GeOx films are metastable and decompose into two phases - Ge and GeO2. Nanosecond KrF laser irradiation produces significant shrinkage of GeOx films and GeO2:Ge heterolayers caped by thin SiNxOy or SiO2 films. Pulse annealing by both types of lasers stimulate as the process of nanoclusters forming and crystallization of initial amorphous Ge-nanoclusters in the GeO2 matrix. The possibility to use the solid germanium monoxide (GeO(s)) and GeO2:Ge heterolayers (without cap layers) as nano-resist in laser nanolithography was demonstrated. The new nanostructured material was formed - the layers of nanofoam GeO2 which can be obtained only with application of femtosecond laser pulse treatments.",
keywords = "Femto-and nanosecond laser modification, Ge-nanoclusters in GeO, Nano-foam",
author = "Gorokhov, {E. B.} and Volodin, {V. A.} and Kuznetsov, {A. I.} and Chichkov, {B. N.} and Astankova, {K. N.} and Azarov, {I. A.}",
year = "2011",
month = feb,
day = "7",
doi = "10.1117/12.882043",
language = "English",
isbn = "9780819485670",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "LAT 2010",
note = "LAT 2010: International Conference on Lasers, Applications, and Technologies ; Conference date: 23-08-2010 Through 26-08-2010",

}

Download

TY - GEN

T1 - Laser treatment of the heterolayers "GeO2:Ge-QDs"

AU - Gorokhov, E. B.

AU - Volodin, V. A.

AU - Kuznetsov, A. I.

AU - Chichkov, B. N.

AU - Astankova, K. N.

AU - Azarov, I. A.

PY - 2011/2/7

Y1 - 2011/2/7

N2 - Treatments by femtosecond Ti-sapphire laser (wavelength is 800 nm, pulse duration is <30 fs) and nanosecond KrF excimer laser (wavelength is 248 nm, pulse duration is 25 ns) were performed to study the impact of laser fluence, pulse duration and energy of photons on the process of chemical and structural reconstructions in GeOx and GeO2:Ge heterolayers. The solid GeOx films are metastable and decompose into two phases - Ge and GeO2. Nanosecond KrF laser irradiation produces significant shrinkage of GeOx films and GeO2:Ge heterolayers caped by thin SiNxOy or SiO2 films. Pulse annealing by both types of lasers stimulate as the process of nanoclusters forming and crystallization of initial amorphous Ge-nanoclusters in the GeO2 matrix. The possibility to use the solid germanium monoxide (GeO(s)) and GeO2:Ge heterolayers (without cap layers) as nano-resist in laser nanolithography was demonstrated. The new nanostructured material was formed - the layers of nanofoam GeO2 which can be obtained only with application of femtosecond laser pulse treatments.

AB - Treatments by femtosecond Ti-sapphire laser (wavelength is 800 nm, pulse duration is <30 fs) and nanosecond KrF excimer laser (wavelength is 248 nm, pulse duration is 25 ns) were performed to study the impact of laser fluence, pulse duration and energy of photons on the process of chemical and structural reconstructions in GeOx and GeO2:Ge heterolayers. The solid GeOx films are metastable and decompose into two phases - Ge and GeO2. Nanosecond KrF laser irradiation produces significant shrinkage of GeOx films and GeO2:Ge heterolayers caped by thin SiNxOy or SiO2 films. Pulse annealing by both types of lasers stimulate as the process of nanoclusters forming and crystallization of initial amorphous Ge-nanoclusters in the GeO2 matrix. The possibility to use the solid germanium monoxide (GeO(s)) and GeO2:Ge heterolayers (without cap layers) as nano-resist in laser nanolithography was demonstrated. The new nanostructured material was formed - the layers of nanofoam GeO2 which can be obtained only with application of femtosecond laser pulse treatments.

KW - Femto-and nanosecond laser modification

KW - Ge-nanoclusters in GeO

KW - Nano-foam

UR - http://www.scopus.com/inward/record.url?scp=79952634360&partnerID=8YFLogxK

U2 - 10.1117/12.882043

DO - 10.1117/12.882043

M3 - Conference contribution

AN - SCOPUS:79952634360

SN - 9780819485670

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - LAT 2010

T2 - LAT 2010: International Conference on Lasers, Applications, and Technologies

Y2 - 23 August 2010 through 26 August 2010

ER -