Laser damage threshold of MgF2 thin films by photoacoustic beam deflection

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review

Autoren

  • Maria Lucia Protopapa
  • Maria Rita Perrone
  • Angela Piegari
  • Enrico Masetti
  • Detlev Ristau
  • Etienne Quesnel
  • Angela Duparre

Externe Organisationen

  • Laser Zentrum Hannover e.V. (LZH)
  • Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
  • CEA-LETI
  • ENEA-Cassacia
  • University of Salento
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des SammelwerksLaser-Induced Damage in Optical Materials: 1999
Untertitel4 - 7 October 1999, Boulder, Colorado ; proceedings
ErscheinungsortBellingham
Herausgeber (Verlag)SPIE
Seiten175-181
Seitenumfang7
ISBN (Print)0-8194-3508-2
PublikationsstatusVeröffentlicht - 3 März 2000
Extern publiziertJa
Veranstaltung31st Annual Boulder Damage Symposium: 'Laser-Induced Damage in Optical Materials 1999' - Boulder, CO, USA
Dauer: 4 Okt. 1999 → 7 Okt. 1999

Publikationsreihe

NameProceedings of SPIE - The International Society for Optical Engineering
Herausgeber (Verlag)SPIE
Band3902
ISSN (Print)0277-786X

Abstract

The photoacoustic beam deflection technique at λ = 248 nm was employed for the measurement of the laser damage threshold of single films of magnesium fluoride deposited on superpolished calcium fluoride and fused silica substrates. Different samples were investigated. All films have similar thickness but are deposited by various techniques (ion-beam sputtering, boat and e-beam thermal evaporation) in different laboratories. The samples are fully characterized, both from the optical and the structural point of view, in the framework of a European Project on `UV-Coatings'. The results of these measurements are reported, along with the data on laser damage threshold, to find out which are the most significant parameters for laser applications.

ASJC Scopus Sachgebiete

Zitieren

Laser damage threshold of MgF2 thin films by photoacoustic beam deflection. / Protopapa, Maria Lucia; Perrone, Maria Rita; Piegari, Angela et al.
Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Bellingham: SPIE, 2000. S. 175-181 (Proceedings of SPIE - The International Society for Optical Engineering; Band 3902).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review

Protopapa, ML, Perrone, MR, Piegari, A, Masetti, E, Ristau, D, Quesnel, E & Duparre, A 2000, Laser damage threshold of MgF2 thin films by photoacoustic beam deflection. in Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Proceedings of SPIE - The International Society for Optical Engineering, Bd. 3902, SPIE, Bellingham, S. 175-181, 31st Annual Boulder Damage Symposium: 'Laser-Induced Damage in Optical Materials 1999', Boulder, CO, USA, 4 Okt. 1999. https://doi.org/10.1117/12.379303
Protopapa, M. L., Perrone, M. R., Piegari, A., Masetti, E., Ristau, D., Quesnel, E., & Duparre, A. (2000). Laser damage threshold of MgF2 thin films by photoacoustic beam deflection. In Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings (S. 175-181). (Proceedings of SPIE - The International Society for Optical Engineering; Band 3902). SPIE. https://doi.org/10.1117/12.379303
Protopapa ML, Perrone MR, Piegari A, Masetti E, Ristau D, Quesnel E et al. Laser damage threshold of MgF2 thin films by photoacoustic beam deflection. in Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Bellingham: SPIE. 2000. S. 175-181. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.379303
Protopapa, Maria Lucia ; Perrone, Maria Rita ; Piegari, Angela et al. / Laser damage threshold of MgF2 thin films by photoacoustic beam deflection. Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Bellingham : SPIE, 2000. S. 175-181 (Proceedings of SPIE - The International Society for Optical Engineering).
Download
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