Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 1368-1376 |
| Seitenumfang | 9 |
| Fachzeitschrift | Applied Optics |
| Jahrgang | 52 |
| Ausgabenummer | 7 |
| Publikationsstatus | Veröffentlicht - 1 März 2013 |
Abstract
We report on the correlation between the laser damage resistance, the optical and the physical properties of Sc2O3/SiO2 mixture coatings. Several sets of samples with ten different mixture ratios have been prepared by ion-beam sputtering. The atomic compositions of the mixture thin films are quantified employing x-ray photoelectron spectroscopy depth profiles. Laser-induced damage thresholds are determined with single subpicosecond pulses (500 fs) at 1030 nm. Furthermore, Son1 multishot measurements are realized in the ultraviolet wavelength range (355 nm) at pulse durations of 5 ns. In addition, the influence of two different substrate polishing qualities on the radiation resistance of the composite thin films is discussed.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Atom- und Molekularphysik sowie Optik
- Ingenieurwesen (insg.)
- Ingenieurwesen (sonstige)
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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in: Applied Optics, Jahrgang 52, Nr. 7, 01.03.2013, S. 1368-1376.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Laser damage resistance of ion-beam sputtered Sc2O3/SiO2 mixture optical coatings
AU - Mende, Mathias
AU - Schrameyer, Stefan
AU - Ehlers, Henrik
AU - Ristau, Detlev
AU - Gallais, Laurent
PY - 2013/3/1
Y1 - 2013/3/1
N2 - We report on the correlation between the laser damage resistance, the optical and the physical properties of Sc2O3/SiO2 mixture coatings. Several sets of samples with ten different mixture ratios have been prepared by ion-beam sputtering. The atomic compositions of the mixture thin films are quantified employing x-ray photoelectron spectroscopy depth profiles. Laser-induced damage thresholds are determined with single subpicosecond pulses (500 fs) at 1030 nm. Furthermore, Son1 multishot measurements are realized in the ultraviolet wavelength range (355 nm) at pulse durations of 5 ns. In addition, the influence of two different substrate polishing qualities on the radiation resistance of the composite thin films is discussed.
AB - We report on the correlation between the laser damage resistance, the optical and the physical properties of Sc2O3/SiO2 mixture coatings. Several sets of samples with ten different mixture ratios have been prepared by ion-beam sputtering. The atomic compositions of the mixture thin films are quantified employing x-ray photoelectron spectroscopy depth profiles. Laser-induced damage thresholds are determined with single subpicosecond pulses (500 fs) at 1030 nm. Furthermore, Son1 multishot measurements are realized in the ultraviolet wavelength range (355 nm) at pulse durations of 5 ns. In addition, the influence of two different substrate polishing qualities on the radiation resistance of the composite thin films is discussed.
UR - http://www.scopus.com/inward/record.url?scp=84875014228&partnerID=8YFLogxK
U2 - 10.1364/AO.52.001368
DO - 10.1364/AO.52.001368
M3 - Article
AN - SCOPUS:84875014228
VL - 52
SP - 1368
EP - 1376
JO - Applied Optics
JF - Applied Optics
SN - 1559-128X
IS - 7
ER -