Ion Implantation of As, P, B, BF and BF2 on Planar and Alkaline-Textured Si(001) Surfaces for Photovoltaic Applications

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OriginalspracheEnglisch
Titel des Sammelwerks2018 22nd International Conference on Ion Implantation Technology, IIT 2018 - Proceedings
Herausgeber/-innenVolker Haublein, Heiner Ryssel
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers Inc.
Seiten90-93
Seitenumfang4
ISBN (elektronisch)9781538668283
PublikationsstatusVeröffentlicht - Sept. 2018
Veranstaltung22nd International Conference on Ion Implantation Technology, IIT 2018 - Wurzburg, Deutschland
Dauer: 16 Sept. 201821 Sept. 2018

Publikationsreihe

NameProceedings of the International Conference on Ion Implantation Technology
Band2018-September

Abstract

We compare the electrical behavior of different dopant species (As, P, B, BF, BF2) on solar-relevant surfaces (alkaline textured and planar). We find significant differences when substituting B by BF or BF2 as well as when using As instead of P. For the latter equivalent recombination behavior is observed, whereas the sheet resistance is higher when using As. The use of F containing p-type species leads to an increase in sheet resistance and saturation current density.

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Ion Implantation of As, P, B, BF and BF2 on Planar and Alkaline-Textured Si(001) Surfaces for Photovoltaic Applications. / Krügener, Jan; Kiefer, Fabian; Peibst, Robby et al.
2018 22nd International Conference on Ion Implantation Technology, IIT 2018 - Proceedings. Hrsg. / Volker Haublein; Heiner Ryssel. Institute of Electrical and Electronics Engineers Inc., 2018. S. 90-93 8807962 (Proceedings of the International Conference on Ion Implantation Technology; Band 2018-September).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Krügener, J, Kiefer, F, Peibst, R & Osten, HJ 2018, Ion Implantation of As, P, B, BF and BF2 on Planar and Alkaline-Textured Si(001) Surfaces for Photovoltaic Applications. in V Haublein & H Ryssel (Hrsg.), 2018 22nd International Conference on Ion Implantation Technology, IIT 2018 - Proceedings., 8807962, Proceedings of the International Conference on Ion Implantation Technology, Bd. 2018-September, Institute of Electrical and Electronics Engineers Inc., S. 90-93, 22nd International Conference on Ion Implantation Technology, IIT 2018, Wurzburg, Deutschland, 16 Sept. 2018. https://doi.org/10.1109/iit.2018.8807962
Krügener, J., Kiefer, F., Peibst, R., & Osten, H. J. (2018). Ion Implantation of As, P, B, BF and BF2 on Planar and Alkaline-Textured Si(001) Surfaces for Photovoltaic Applications. In V. Haublein, & H. Ryssel (Hrsg.), 2018 22nd International Conference on Ion Implantation Technology, IIT 2018 - Proceedings (S. 90-93). Artikel 8807962 (Proceedings of the International Conference on Ion Implantation Technology; Band 2018-September). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/iit.2018.8807962
Krügener J, Kiefer F, Peibst R, Osten HJ. Ion Implantation of As, P, B, BF and BF2 on Planar and Alkaline-Textured Si(001) Surfaces for Photovoltaic Applications. in Haublein V, Ryssel H, Hrsg., 2018 22nd International Conference on Ion Implantation Technology, IIT 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2018. S. 90-93. 8807962. (Proceedings of the International Conference on Ion Implantation Technology). doi: 10.1109/iit.2018.8807962
Krügener, Jan ; Kiefer, Fabian ; Peibst, Robby et al. / Ion Implantation of As, P, B, BF and BF2 on Planar and Alkaline-Textured Si(001) Surfaces for Photovoltaic Applications. 2018 22nd International Conference on Ion Implantation Technology, IIT 2018 - Proceedings. Hrsg. / Volker Haublein ; Heiner Ryssel. Institute of Electrical and Electronics Engineers Inc., 2018. S. 90-93 (Proceedings of the International Conference on Ion Implantation Technology).
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title = "Ion Implantation of As, P, B, BF and BF2 on Planar and Alkaline-Textured Si(001) Surfaces for Photovoltaic Applications",
abstract = "We compare the electrical behavior of different dopant species (As, P, B, BF, BF2) on solar-relevant surfaces (alkaline textured and planar). We find significant differences when substituting B by BF or BF2 as well as when using As instead of P. For the latter equivalent recombination behavior is observed, whereas the sheet resistance is higher when using As. The use of F containing p-type species leads to an increase in sheet resistance and saturation current density.",
keywords = "ion implantation, silicon, solar cells",
author = "Jan Kr{\"u}gener and Fabian Kiefer and Robby Peibst and Osten, {H. J{\"o}rg}",
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AU - Krügener, Jan

AU - Kiefer, Fabian

AU - Peibst, Robby

AU - Osten, H. Jörg

N1 - Funding information: ACKNOWLEDGMENT This work was funded by the German Federal Ministry for Economic Affairs and Energy (BMWi) under contract no. 0325480C and no. 0325827C.

PY - 2018/9

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N2 - We compare the electrical behavior of different dopant species (As, P, B, BF, BF2) on solar-relevant surfaces (alkaline textured and planar). We find significant differences when substituting B by BF or BF2 as well as when using As instead of P. For the latter equivalent recombination behavior is observed, whereas the sheet resistance is higher when using As. The use of F containing p-type species leads to an increase in sheet resistance and saturation current density.

AB - We compare the electrical behavior of different dopant species (As, P, B, BF, BF2) on solar-relevant surfaces (alkaline textured and planar). We find significant differences when substituting B by BF or BF2 as well as when using As instead of P. For the latter equivalent recombination behavior is observed, whereas the sheet resistance is higher when using As. The use of F containing p-type species leads to an increase in sheet resistance and saturation current density.

KW - ion implantation

KW - silicon

KW - solar cells

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U2 - 10.1109/iit.2018.8807962

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M3 - Conference contribution

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T3 - Proceedings of the International Conference on Ion Implantation Technology

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BT - 2018 22nd International Conference on Ion Implantation Technology, IIT 2018 - Proceedings

A2 - Haublein, Volker

A2 - Ryssel, Heiner

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 22nd International Conference on Ion Implantation Technology, IIT 2018

Y2 - 16 September 2018 through 21 September 2018

ER -

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