Investigations on SiO2/HfO2 mixtures for nanosecond and femtosecond pulses

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • Lars O. Jensen
  • Mathias Mende
  • Holger Blaschke
  • Detlev Ristau
  • Duy Nguyen
  • Luke Emmert
  • Wolfgang Rudolph

Externe Organisationen

  • Laser Zentrum Hannover e.V. (LZH)
  • University of New Mexico
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des Sammelwerks42nd Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials
Untertitel2010
PublikationsstatusVeröffentlicht - 30 Nov. 2010
Extern publiziertJa
Veranstaltung42nd Annual Laser Damage Symposium: Laser-Induced Damage in Optical Materials: 2010 - Boulder, CO, USA / Vereinigte Staaten
Dauer: 26 Sept. 201029 Sept. 2010

Publikationsreihe

NameProceedings of SPIE - The International Society for Optical Engineering
Band7842
ISSN (Print)0277-786X

Abstract

After several investigations in laser induced damage behavior of oxide mixtures of different compositions, also HfO2 could be steplessly mixed with SiO2. A study of SiO2/HfO2 IBS single layers and high reflectors is presented. Damage testing has been performed at 800nm and 355nm on an extensive set of single layers employing different mixture ratios of silica and hafnia. The analysis of the response of optical single layer coatings to femtosecond and nanosecond pulse exposure provides input for further coating designs, in particular for the optimization in respect to the damage threshold properties. A deeper understanding of the damage mechanisms is gained by comparing the ns and fs pulse results as a function of the mixing ratio.

ASJC Scopus Sachgebiete

Zitieren

Investigations on SiO2/HfO2 mixtures for nanosecond and femtosecond pulses. / Jensen, Lars O.; Mende, Mathias; Blaschke, Holger et al.
42nd Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2010. 2010. 784207 (Proceedings of SPIE - The International Society for Optical Engineering; Band 7842).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Jensen, LO, Mende, M, Blaschke, H, Ristau, D, Nguyen, D, Emmert, L & Rudolph, W 2010, Investigations on SiO2/HfO2 mixtures for nanosecond and femtosecond pulses. in 42nd Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2010., 784207, Proceedings of SPIE - The International Society for Optical Engineering, Bd. 7842, 42nd Annual Laser Damage Symposium, Boulder, CO, USA / Vereinigte Staaten, 26 Sept. 2010. https://doi.org/10.1117/12.867238
Jensen, L. O., Mende, M., Blaschke, H., Ristau, D., Nguyen, D., Emmert, L., & Rudolph, W. (2010). Investigations on SiO2/HfO2 mixtures for nanosecond and femtosecond pulses. In 42nd Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2010 Artikel 784207 (Proceedings of SPIE - The International Society for Optical Engineering; Band 7842). https://doi.org/10.1117/12.867238
Jensen LO, Mende M, Blaschke H, Ristau D, Nguyen D, Emmert L et al. Investigations on SiO2/HfO2 mixtures for nanosecond and femtosecond pulses. in 42nd Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2010. 2010. 784207. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.867238
Jensen, Lars O. ; Mende, Mathias ; Blaschke, Holger et al. / Investigations on SiO2/HfO2 mixtures for nanosecond and femtosecond pulses. 42nd Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2010. 2010. (Proceedings of SPIE - The International Society for Optical Engineering).
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abstract = "After several investigations in laser induced damage behavior of oxide mixtures of different compositions, also HfO2 could be steplessly mixed with SiO2. A study of SiO2/HfO2 IBS single layers and high reflectors is presented. Damage testing has been performed at 800nm and 355nm on an extensive set of single layers employing different mixture ratios of silica and hafnia. The analysis of the response of optical single layer coatings to femtosecond and nanosecond pulse exposure provides input for further coating designs, in particular for the optimization in respect to the damage threshold properties. A deeper understanding of the damage mechanisms is gained by comparing the ns and fs pulse results as a function of the mixing ratio.",
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