Intrinsic stress development and microstructure evolution of Au/Cr/Si multilayer thin films subject to annealing

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • David C. Miller
  • Cari F. Herrmann
  • Hans J. Maier
  • Steve M. George
  • Conrad R. Stoldt
  • Ken Gall

Externe Organisationen

  • University of Colorado Boulder
  • Universität Paderborn
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Details

OriginalspracheEnglisch
Seiten (von - bis)873-879
Seitenumfang7
FachzeitschriftScripta materialia
Jahrgang52
Ausgabenummer9
PublikationsstatusVeröffentlicht - Mai 2005
Extern publiziertJa

Abstract

Au/Cr/Si microcantilevers were studied in their as-deposited condition and annealed state, with emphasis on a thermal treatment of 225 °C for 24 h. Change in beam curvature was monitored during isothermal hold as a function of time. Secondary grain growth was observed in the gold, which contained non-uniformly distributed twins and dislocation defects. Diffusional transport of the chromium layer was observed during annealing. Nodules arranged in a "rolling hill" topography were observed at the free surface, both before and after annealing. Nanometer thick coatings of alumina grown by atomic layer deposition improved the uniformity of both microstructure evolution and curvature evolution during high-temperature annealing.

ASJC Scopus Sachgebiete

Zitieren

Intrinsic stress development and microstructure evolution of Au/Cr/Si multilayer thin films subject to annealing. / Miller, David C.; Herrmann, Cari F.; Maier, Hans J. et al.
in: Scripta materialia, Jahrgang 52, Nr. 9, 05.2005, S. 873-879.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Miller DC, Herrmann CF, Maier HJ, George SM, Stoldt CR, Gall K. Intrinsic stress development and microstructure evolution of Au/Cr/Si multilayer thin films subject to annealing. Scripta materialia. 2005 Mai;52(9):873-879. doi: 10.1016/j.scriptamat.2005.01.004
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abstract = "Au/Cr/Si microcantilevers were studied in their as-deposited condition and annealed state, with emphasis on a thermal treatment of 225 °C for 24 h. Change in beam curvature was monitored during isothermal hold as a function of time. Secondary grain growth was observed in the gold, which contained non-uniformly distributed twins and dislocation defects. Diffusional transport of the chromium layer was observed during annealing. Nodules arranged in a {"}rolling hill{"} topography were observed at the free surface, both before and after annealing. Nanometer thick coatings of alumina grown by atomic layer deposition improved the uniformity of both microstructure evolution and curvature evolution during high-temperature annealing.",
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AU - Miller, David C.

AU - Herrmann, Cari F.

AU - Maier, Hans J.

AU - George, Steve M.

AU - Stoldt, Conrad R.

AU - Gall, Ken

N1 - Funding Information: The authors would like to acknowledge Nancy Yang and her research group at Sandia National Laboratories for their help with microscopy and further materials characterization. The work is partially supported by a DOE PECASE for KG.

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KW - Material stability

KW - MEMS

KW - Reliability

KW - Thin metal films

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