Intrinsic Noise and Temperature Coefficients of Selected Voltage References

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • Roland Fleddermann
  • Michael Tröbs
  • Frank Steier
  • Gerhard Heinzel
  • Karsten Danzmann

Organisationseinheiten

Externe Organisationen

  • Max-Planck-Institut für Gravitationsphysik (Albert-Einstein-Institut)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Seiten (von - bis)2002-2007
Seitenumfang6
FachzeitschriftIEEE Transactions on Instrumentation and Measurement
Jahrgang58
Ausgabenummer6
PublikationsstatusVeröffentlicht - Juni 2009

Abstract

We require voltage references with a relative output voltage noise of at most 10-6/√Hz in the frequency range of 0.1 mHz-1 Hz. We have investigated the output voltage noise and the external noise sources of a selection of references. Two external noise sources, i.e., supply voltage and temperature, and their coupling to the output voltage of the references were studied. The effect of supply voltage noise was negligible, whereas temperature noise had to be suppressed by stabilization. We found that samples of AD587LN- and MAX6126AASA50-type references fulfilled the requirements if the ambient temperature was stabilized to a level of approximately 50 mK/√Hz.

ASJC Scopus Sachgebiete

Zitieren

Intrinsic Noise and Temperature Coefficients of Selected Voltage References. / Fleddermann, Roland; Tröbs, Michael; Steier, Frank et al.
in: IEEE Transactions on Instrumentation and Measurement, Jahrgang 58, Nr. 6, 06.2009, S. 2002-2007.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Fleddermann R, Tröbs M, Steier F, Heinzel G, Danzmann K. Intrinsic Noise and Temperature Coefficients of Selected Voltage References. IEEE Transactions on Instrumentation and Measurement. 2009 Jun;58(6):2002-2007. doi: 10.1109/TIM.2008.2006133
Fleddermann, Roland ; Tröbs, Michael ; Steier, Frank et al. / Intrinsic Noise and Temperature Coefficients of Selected Voltage References. in: IEEE Transactions on Instrumentation and Measurement. 2009 ; Jahrgang 58, Nr. 6. S. 2002-2007.
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