Interwire coupling for In(4×1) /Si(111) probed by surface transport

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autorschaft

  • Frederik Edler
  • Ilio Miccoli
  • S. Demuth
  • Herbert Pfnür
  • Stefan Martin Wippermann
  • Andreas Lücke
  • Wolf Gero Schmidt
  • Christoph Tegenkamp

Externe Organisationen

  • Max-Planck-Institut für Eisenforschung GmbH
  • Universität Paderborn
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Aufsatznummer085426
FachzeitschriftPhysical Review B - Condensed Matter and Materials Physics
Jahrgang92
Ausgabenummer8
PublikationsstatusVeröffentlicht - 25 Aug. 2015

Abstract

The In/Si(111) system reveals an anisotropy in the electrical conductivity and is a prototype system for atomic wires on surfaces. We use this system to study and tune the interwire interaction by adsorption of oxygen. Through rotational square four-tip transport measurements, both the parallel (σ||) and perpendicular (σ) components are measured separately. The analysis of the I(V) curves reveals that σ is also affected by adsorption of oxygen, showing clearly an effective interwire coupling, in agreement with density-functional-theory-based calculations of the transmittance. In addition to these surface-state mediated transport channels, we confirm the existence of conducting parasitic space-charge layer channels and address the importance of substrate steps by performing the transport measurements of In phases grown on Si(111) mesa structures.

ASJC Scopus Sachgebiete

Zitieren

Interwire coupling for In(4×1) /Si(111) probed by surface transport. / Edler, Frederik; Miccoli, Ilio; Demuth, S. et al.
in: Physical Review B - Condensed Matter and Materials Physics, Jahrgang 92, Nr. 8, 085426, 25.08.2015.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Edler, F, Miccoli, I, Demuth, S, Pfnür, H, Wippermann, SM, Lücke, A, Schmidt, WG & Tegenkamp, C 2015, 'Interwire coupling for In(4×1) /Si(111) probed by surface transport', Physical Review B - Condensed Matter and Materials Physics, Jg. 92, Nr. 8, 085426. https://doi.org/10.1103/PhysRevB.92.085426
Edler, F., Miccoli, I., Demuth, S., Pfnür, H., Wippermann, S. M., Lücke, A., Schmidt, W. G., & Tegenkamp, C. (2015). Interwire coupling for In(4×1) /Si(111) probed by surface transport. Physical Review B - Condensed Matter and Materials Physics, 92(8), Artikel 085426. https://doi.org/10.1103/PhysRevB.92.085426
Edler F, Miccoli I, Demuth S, Pfnür H, Wippermann SM, Lücke A et al. Interwire coupling for In(4×1) /Si(111) probed by surface transport. Physical Review B - Condensed Matter and Materials Physics. 2015 Aug 25;92(8):085426. doi: 10.1103/PhysRevB.92.085426
Edler, Frederik ; Miccoli, Ilio ; Demuth, S. et al. / Interwire coupling for In(4×1) /Si(111) probed by surface transport. in: Physical Review B - Condensed Matter and Materials Physics. 2015 ; Jahrgang 92, Nr. 8.
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AU - Edler, Frederik

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AU - Pfnür, Herbert

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AU - Lücke, Andreas

AU - Schmidt, Wolf Gero

AU - Tegenkamp, Christoph

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