Details
Originalsprache | Englisch |
---|---|
Titel des Sammelwerks | Optical Fabrication and Testing |
Untertitel | 26 - 28 May 1999, Berlin, Germany |
Erscheinungsort | Bellingham |
Herausgeber (Verlag) | SPIE |
Seiten | 548-556 |
Seitenumfang | 9 |
ISBN (Print) | 0-8194-3213-X |
Publikationsstatus | Veröffentlicht - 6 Sept. 1999 |
Extern publiziert | Ja |
Veranstaltung | 1999 Optical Fabrication and Testing - Berlin, Deutschland Dauer: 26 Mai 1999 → 28 Mai 1999 |
Publikationsreihe
Name | Proceedings of SPIE - The International Society for Optical Engineering |
---|---|
Herausgeber (Verlag) | SPIE |
Band | 3739 |
ISSN (Print) | 0277-786X |
Abstract
The measurement of total scatter losses (TSL) is a major prerequisite for the development, optimization and commercialization of high quality optical components. In addition to its influence on laser systems efficiency and beam steering arrangement, TSLs are an important safety aspect for applications of these laser systems. As a consequence, an international standard for TSL measurement in optical components was developed. In the course of technical development and discussion of the standards, called ISO/Draft International Standard 13696 `Test method for radiation scattered by optical components', round robin tests have been conducted to evaluate the procedures involved. The results of these tests are compiled and discussed.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Informatik (insg.)
- Angewandte Informatik
- Mathematik (insg.)
- Angewandte Mathematik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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Optical Fabrication and Testing: 26 - 28 May 1999, Berlin, Germany. Bellingham: SPIE, 1999. S. 548-556 (Proceedings of SPIE - The International Society for Optical Engineering; Band 3739).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - International round-robin experiment on optical total scattering at 633 nm according to ISO/DIS 13696
AU - Kadkhoda, Puja
AU - Amra, Claude
AU - Bennett, Jean M.
AU - Deumie, Carole
AU - Duparre, Angela
AU - Gliech, Stefan
AU - Kessler, Helmut
AU - Lauth, Hans
AU - Lindstroem, Tomas
AU - Mueller, A.
AU - Reng, Norbert
AU - Ribbing, Carl Gustaf
AU - Ristau, Detlev
AU - Schuhmann, Ranier
AU - Jolie, Christian
AU - Tilsch, Markus
PY - 1999/9/6
Y1 - 1999/9/6
N2 - The measurement of total scatter losses (TSL) is a major prerequisite for the development, optimization and commercialization of high quality optical components. In addition to its influence on laser systems efficiency and beam steering arrangement, TSLs are an important safety aspect for applications of these laser systems. As a consequence, an international standard for TSL measurement in optical components was developed. In the course of technical development and discussion of the standards, called ISO/Draft International Standard 13696 `Test method for radiation scattered by optical components', round robin tests have been conducted to evaluate the procedures involved. The results of these tests are compiled and discussed.
AB - The measurement of total scatter losses (TSL) is a major prerequisite for the development, optimization and commercialization of high quality optical components. In addition to its influence on laser systems efficiency and beam steering arrangement, TSLs are an important safety aspect for applications of these laser systems. As a consequence, an international standard for TSL measurement in optical components was developed. In the course of technical development and discussion of the standards, called ISO/Draft International Standard 13696 `Test method for radiation scattered by optical components', round robin tests have been conducted to evaluate the procedures involved. The results of these tests are compiled and discussed.
UR - http://www.scopus.com/inward/record.url?scp=0032671839&partnerID=8YFLogxK
U2 - 10.1117/12.360187
DO - 10.1117/12.360187
M3 - Conference contribution
AN - SCOPUS:0032671839
SN - 0-8194-3213-X
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 548
EP - 556
BT - Optical Fabrication and Testing
PB - SPIE
CY - Bellingham
T2 - 1999 Optical Fabrication and Testing
Y2 - 26 May 1999 through 28 May 1999
ER -