Details
Originalsprache | Englisch |
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Titel des Sammelwerks | Proceedings of the 2008 Conference on Optoelectronic and Microelectronic Materials and Devices |
Untertitel | COMMAD'08 |
Seiten | 166-169 |
Seitenumfang | 4 |
Publikationsstatus | Veröffentlicht - 2008 |
Veranstaltung | 2008 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD'08 - Sydney, NSW, Australien Dauer: 28 Juli 2008 → 1 Aug. 2008 |
Publikationsreihe
Name | Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD |
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Abstract
Si quantum dots (QD) embedded into Gd2O3 and Si quantum wells (QW) with epitaxial Gd2O3 as the barrier layers were grown on Si substrates. With decreasing dot size down to the 2-nm range, the optical absorption exhibits a spectacular shift in spectral threshold upto 2.9±0.1 eV, as compared to the 1.12 eV absorption edge of the bulk Si crystal. Such shift suggests a significant influence of quantum confinement on the nanocrystal/oxide interface band diagram; the effect of which was observed to be predominantly caused by the upshift of the nanocrystal conduction band. Also, the Pt/Gd2O3/Si MOS capacitors comprised with Si nanoclusters display large hysteresis (∼1.5-2V) in capacitance-voltage measurements making them potential candidate of nonvolatile memory devices.
ASJC Scopus Sachgebiete
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
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Proceedings of the 2008 Conference on Optoelectronic and Microelectronic Materials and Devices: COMMAD'08. 2008. S. 166-169 4802118 (Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Integration of low dimensional crystalline Si into functional epitaxial oxides for next generation solar cell application
AU - Laha, A.
AU - Fissel, A.
AU - Bugiel, E.
AU - Badylevich, M.
AU - Afanasiev, V.
AU - Osten, H. J.
PY - 2008
Y1 - 2008
N2 - Si quantum dots (QD) embedded into Gd2O3 and Si quantum wells (QW) with epitaxial Gd2O3 as the barrier layers were grown on Si substrates. With decreasing dot size down to the 2-nm range, the optical absorption exhibits a spectacular shift in spectral threshold upto 2.9±0.1 eV, as compared to the 1.12 eV absorption edge of the bulk Si crystal. Such shift suggests a significant influence of quantum confinement on the nanocrystal/oxide interface band diagram; the effect of which was observed to be predominantly caused by the upshift of the nanocrystal conduction band. Also, the Pt/Gd2O3/Si MOS capacitors comprised with Si nanoclusters display large hysteresis (∼1.5-2V) in capacitance-voltage measurements making them potential candidate of nonvolatile memory devices.
AB - Si quantum dots (QD) embedded into Gd2O3 and Si quantum wells (QW) with epitaxial Gd2O3 as the barrier layers were grown on Si substrates. With decreasing dot size down to the 2-nm range, the optical absorption exhibits a spectacular shift in spectral threshold upto 2.9±0.1 eV, as compared to the 1.12 eV absorption edge of the bulk Si crystal. Such shift suggests a significant influence of quantum confinement on the nanocrystal/oxide interface band diagram; the effect of which was observed to be predominantly caused by the upshift of the nanocrystal conduction band. Also, the Pt/Gd2O3/Si MOS capacitors comprised with Si nanoclusters display large hysteresis (∼1.5-2V) in capacitance-voltage measurements making them potential candidate of nonvolatile memory devices.
KW - MBE
KW - Si-QD
KW - Solar cells
UR - http://www.scopus.com/inward/record.url?scp=64849095782&partnerID=8YFLogxK
U2 - 10.1109/COMMAD.2008.4802118
DO - 10.1109/COMMAD.2008.4802118
M3 - Conference contribution
AN - SCOPUS:64849095782
SN - 9781424427178
T3 - Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD
SP - 166
EP - 169
BT - Proceedings of the 2008 Conference on Optoelectronic and Microelectronic Materials and Devices
T2 - 2008 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD'08
Y2 - 28 July 2008 through 1 August 2008
ER -