Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 63-65 |
| Seitenumfang | 3 |
| Fachzeitschrift | SOLID STATE IONICS |
| Jahrgang | 298 |
| Frühes Online-Datum | 18 Nov. 2016 |
| Publikationsstatus | Veröffentlicht - 15 Dez. 2016 |
Abstract
We demonstrate in a photoemission electron microscopy (PEEM) study of Pt/YSZ in vacuum that an open circuit (OC) potential can develop which we attribute to an inner photoelectric effect caused by the irradiation with UV light. The appearance of an OC potential is linked to the existence of a high voltage (HV) of at least 5 kV between sample and PEEM instrument. The OC potential grows with increasing HV reaching about − 200 mV at a HV of 12 kV. The effect represents a potential artefact in PEEM studies of solid ionic conductors with sufficiently small band gap (< 6 eV for photons from D2 discharge lamp).
ASJC Scopus Sachgebiete
- Chemie (insg.)
- Allgemeine Chemie
- Werkstoffwissenschaften (insg.)
- Allgemeine Materialwissenschaften
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
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in: SOLID STATE IONICS, Jahrgang 298, 15.12.2016, S. 63-65.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Inner photoelectric effect at Pt/YSZ interface during photoemission electron microscopy
AU - Toghan, Arafat
AU - Imbihl, Ronald
PY - 2016/12/15
Y1 - 2016/12/15
N2 - We demonstrate in a photoemission electron microscopy (PEEM) study of Pt/YSZ in vacuum that an open circuit (OC) potential can develop which we attribute to an inner photoelectric effect caused by the irradiation with UV light. The appearance of an OC potential is linked to the existence of a high voltage (HV) of at least 5 kV between sample and PEEM instrument. The OC potential grows with increasing HV reaching about − 200 mV at a HV of 12 kV. The effect represents a potential artefact in PEEM studies of solid ionic conductors with sufficiently small band gap (< 6 eV for photons from D2 discharge lamp).
AB - We demonstrate in a photoemission electron microscopy (PEEM) study of Pt/YSZ in vacuum that an open circuit (OC) potential can develop which we attribute to an inner photoelectric effect caused by the irradiation with UV light. The appearance of an OC potential is linked to the existence of a high voltage (HV) of at least 5 kV between sample and PEEM instrument. The OC potential grows with increasing HV reaching about − 200 mV at a HV of 12 kV. The effect represents a potential artefact in PEEM studies of solid ionic conductors with sufficiently small band gap (< 6 eV for photons from D2 discharge lamp).
KW - Open circuit potential
KW - Photoelectric effect
KW - Photoemission electron microscopy
KW - Platinum film electrode
KW - Yttrium stabilized zirconia
UR - http://www.scopus.com/inward/record.url?scp=84997531420&partnerID=8YFLogxK
U2 - 10.1016/j.ssi.2016.11.005
DO - 10.1016/j.ssi.2016.11.005
M3 - Article
AN - SCOPUS:84997531420
VL - 298
SP - 63
EP - 65
JO - SOLID STATE IONICS
JF - SOLID STATE IONICS
SN - 0167-2738
ER -