Influence of the substrate resistivity on the broadband propagation characteristics of silicon transmission lines

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review

Autoren

  • Uwe Arz
  • Hartmut Grabinski
  • Dylan F. Williams

Organisationseinheiten

Externe Organisationen

  • National Institute of Standards and Technology (NIST)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des Sammelwerks54th ARFTG Conference Digest Fall 1999
UntertitelAutomatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers Inc.
ISBN (elektronisch)0780356861, 9780780356863
PublikationsstatusVeröffentlicht - 1999
Veranstaltung54th Automatic RF Techniques Group, ARFTG Fall 1999 - Atlanta, USA / Vereinigte Staaten
Dauer: 2 Dez. 1999 → 3 Dez. 1999

Publikationsreihe

Name54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999

Abstract

This work investigates the broadband propagation characteristics of transmission lines fabricated on silicon substrates of different conductivities. We compare calculations to measurements and examine the sensitivity of the frequency-dependent line parameters to substrate conductivity.

ASJC Scopus Sachgebiete

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Influence of the substrate resistivity on the broadband propagation characteristics of silicon transmission lines. / Arz, Uwe; Grabinski, Hartmut; Williams, Dylan F.
54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999. Institute of Electrical and Electronics Engineers Inc., 1999. 4120066 (54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review

Arz, U, Grabinski, H & Williams, DF 1999, Influence of the substrate resistivity on the broadband propagation characteristics of silicon transmission lines. in 54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999., 4120066, 54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999, Institute of Electrical and Electronics Engineers Inc., 54th Automatic RF Techniques Group, ARFTG Fall 1999, Atlanta, USA / Vereinigte Staaten, 2 Dez. 1999. https://doi.org/10.1109/ARFTG.1999.327364
Arz, U., Grabinski, H., & Williams, D. F. (1999). Influence of the substrate resistivity on the broadband propagation characteristics of silicon transmission lines. In 54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999 Artikel 4120066 (54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ARFTG.1999.327364
Arz U, Grabinski H, Williams DF. Influence of the substrate resistivity on the broadband propagation characteristics of silicon transmission lines. in 54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999. Institute of Electrical and Electronics Engineers Inc. 1999. 4120066. (54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999). doi: 10.1109/ARFTG.1999.327364
Arz, Uwe ; Grabinski, Hartmut ; Williams, Dylan F. / Influence of the substrate resistivity on the broadband propagation characteristics of silicon transmission lines. 54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999. Institute of Electrical and Electronics Engineers Inc., 1999. (54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999).
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