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Influence of oval defects on transport properties in high-mobility two-dimensional electron gases

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

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OriginalspracheEnglisch
Aufsatznummer092103
FachzeitschriftApplied physics letters
Jahrgang108
Ausgabenummer9
PublikationsstatusVeröffentlicht - 29 Feb. 2016

Abstract

Rare macroscopic growth defects next to a two-dimensional electron gas influence transport properties and cause a negative magnetoresistance. On the basis of this, we show that the number of oval defects seen on the material surface is comparable with the density of macroscopic growth defects determined from the negative magnetoresistance. We examine several materials with different densities of oval defects nS which were grown in one cycle under the same conditions to verify our observations. Paradoxically, the material with the largest number of oval defects has also the highest electron mobility.

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Influence of oval defects on transport properties in high-mobility two-dimensional electron gases. / Bockhorn, L.; Velieva, A.; Hakim, S. et al.
in: Applied physics letters, Jahrgang 108, Nr. 9, 092103, 29.02.2016.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Bockhorn L, Velieva A, Hakim S, Wagner T, Rugeramigabo EP, Schuh D et al. Influence of oval defects on transport properties in high-mobility two-dimensional electron gases. Applied physics letters. 2016 Feb 29;108(9):092103. doi: 10.1063/1.4942886
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AU - Bockhorn, L.

AU - Velieva, A.

AU - Hakim, S.

AU - Wagner, T.

AU - Rugeramigabo, E. P.

AU - Schuh, D.

AU - Reichl, C.

AU - Wegscheider, W.

AU - Haug, R. J.

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N2 - Rare macroscopic growth defects next to a two-dimensional electron gas influence transport properties and cause a negative magnetoresistance. On the basis of this, we show that the number of oval defects seen on the material surface is comparable with the density of macroscopic growth defects determined from the negative magnetoresistance. We examine several materials with different densities of oval defects nS which were grown in one cycle under the same conditions to verify our observations. Paradoxically, the material with the largest number of oval defects has also the highest electron mobility.

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