Influence of bulk pre-straining on the size effect in nickel compression pillars

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • A. S. Schneider
  • D. Kiener
  • C. M. Yakacki
  • H. J. Maier
  • P. A. Gruber
  • N. Tamura
  • M. Kunz
  • A. M. Minor
  • C. P. Frick

Externe Organisationen

  • Leibniz-Institut für Neue Materialien gGmbH (INM)
  • University of Leoben
  • University of Colorado Denver
  • Universität Paderborn
  • Karlsruher Institut für Technologie (KIT)
  • Lawrence Berkeley National Laboratory
  • University of California at Berkeley
  • University of Wyoming
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Seiten (von - bis)147-158
Seitenumfang12
FachzeitschriftMaterials Science and Engineering A
Jahrgang559
PublikationsstatusVeröffentlicht - 18 Aug. 2012
Extern publiziertJa

Abstract

Micro-compression tests were performed on pre-strained nickel (Ni) single crystals in order to investigate the influence of the initial dislocation arrangement on the size dependence of small-scale metal structures. A bulk Ni sample was grown using the Czochralski method and sectioned into four compression samples, which were then pre-strained to nominal strains of 5, 10, 15 and 20%. Bulk samples were then characterized using transmission electron microscopy (TEM), micro-Laue diffraction, and electron backscatter diffraction. TEM results show that a dislocation cell structure was present for all deformed samples, and Laue diffraction demonstrated that the internal strain increased with increased amount of pre-straining. Small-scale pillars with diameters from 200. nm to 5 μm were focused ion beam (FIB) machined from each of the four deformed bulk samples and further compressed via a nanoindenter equipped with a flat diamond punch. Results demonstrate that bulk pre-straining inhibits the sample size effect. For heavily pre-strained bulk samples, the deformation history does not affect the stress-strain behavior, as the pillars demonstrated elevated strength and rather low strain hardening over the whole investigated size range. In situ TEM and micro-Laue diffraction measurements of pillars confirmed little change in dislocation density during pillar compression. Thus, the dislocation cell walls created by heavy bulk pre-straining become the relevant internal material structure controlling the mechanical properties, dominating the sample size effect observed in the low dislocation density regime.

ASJC Scopus Sachgebiete

Zitieren

Influence of bulk pre-straining on the size effect in nickel compression pillars. / Schneider, A. S.; Kiener, D.; Yakacki, C. M. et al.
in: Materials Science and Engineering A, Jahrgang 559, 18.08.2012, S. 147-158.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Schneider, AS, Kiener, D, Yakacki, CM, Maier, HJ, Gruber, PA, Tamura, N, Kunz, M, Minor, AM & Frick, CP 2012, 'Influence of bulk pre-straining on the size effect in nickel compression pillars', Materials Science and Engineering A, Jg. 559, S. 147-158. https://doi.org/10.1016/j.msea.2012.08.055
Schneider, A. S., Kiener, D., Yakacki, C. M., Maier, H. J., Gruber, P. A., Tamura, N., Kunz, M., Minor, A. M., & Frick, C. P. (2012). Influence of bulk pre-straining on the size effect in nickel compression pillars. Materials Science and Engineering A, 559, 147-158. https://doi.org/10.1016/j.msea.2012.08.055
Schneider AS, Kiener D, Yakacki CM, Maier HJ, Gruber PA, Tamura N et al. Influence of bulk pre-straining on the size effect in nickel compression pillars. Materials Science and Engineering A. 2012 Aug 18;559:147-158. doi: 10.1016/j.msea.2012.08.055
Schneider, A. S. ; Kiener, D. ; Yakacki, C. M. et al. / Influence of bulk pre-straining on the size effect in nickel compression pillars. in: Materials Science and Engineering A. 2012 ; Jahrgang 559. S. 147-158.
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AU - Schneider, A. S.

AU - Kiener, D.

AU - Yakacki, C. M.

AU - Maier, H. J.

AU - Gruber, P. A.

AU - Tamura, N.

AU - Kunz, M.

AU - Minor, A. M.

AU - Frick, C. P.

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KW - Electron microscopy

KW - Micropillar compression

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