Individual-ion addressing with microwave field gradients

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autorschaft

  • U. Warring
  • C. Ospelkaus
  • Y. Colombe
  • R. Jördens
  • D. Leibfried
  • D. J. Wineland

Organisationseinheiten

Externe Organisationen

  • National Institute of Standards and Technology (NIST)
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Details

OriginalspracheEnglisch
Aufsatznummer173002
FachzeitschriftPhysical review letters
Jahrgang110
Ausgabenummer17
PublikationsstatusVeröffentlicht - 22 Apr. 2013

ASJC Scopus Sachgebiete

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Individual-ion addressing with microwave field gradients. / Warring, U.; Ospelkaus, C.; Colombe, Y. et al.
in: Physical review letters, Jahrgang 110, Nr. 17, 173002, 22.04.2013.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Warring, U, Ospelkaus, C, Colombe, Y, Jördens, R, Leibfried, D & Wineland, DJ 2013, 'Individual-ion addressing with microwave field gradients', Physical review letters, Jg. 110, Nr. 17, 173002. https://doi.org/10.1103/PhysRevLett.110.173002
Warring, U., Ospelkaus, C., Colombe, Y., Jördens, R., Leibfried, D., & Wineland, D. J. (2013). Individual-ion addressing with microwave field gradients. Physical review letters, 110(17), Artikel 173002. https://doi.org/10.1103/PhysRevLett.110.173002
Warring U, Ospelkaus C, Colombe Y, Jördens R, Leibfried D, Wineland DJ. Individual-ion addressing with microwave field gradients. Physical review letters. 2013 Apr 22;110(17):173002. doi: 10.1103/PhysRevLett.110.173002
Warring, U. ; Ospelkaus, C. ; Colombe, Y. et al. / Individual-ion addressing with microwave field gradients. in: Physical review letters. 2013 ; Jahrgang 110, Nr. 17.
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