Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | ICPE 2023-ECCE Asia - 11th International Conference on Power Electronics - ECCE Asia |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| Seiten | 3224-3229 |
| Seitenumfang | 6 |
| ISBN (elektronisch) | 9788957083505 |
| ISBN (Print) | 979-8-3503-3620-7 |
| Publikationsstatus | Veröffentlicht - 2023 |
| Veranstaltung | 11th International Conference on Power Electronics - ECCE Asia, ICPE 2023-ECCE Asia - Jeju, Südkorea Dauer: 22 Mai 2023 → 25 Mai 2023 |
Publikationsreihe
| Name | International Conference on Power Electronics |
|---|---|
| ISSN (Print) | 2150-6078 |
| ISSN (elektronisch) | 2150-6086 |
Abstract
In electrified aircraft, cosmic radiation can be a potential hazard to power electronic systems like drive train inverters and dc/dc converters. As the increased failure rate at high altitudes usually requires a voltage derating, a detailed knowledge on the failure rate of the individual power semiconductors is necessary to enable an optimal compromise between failure rate and power density. This data is usually gained by accelerated measurements, which could omit certain influences of the high altitude. Therefore, this paper presents the implementation of a fully automatic long-term measurement system for the determination of the failure rate due to single event burnout under real conditions for power semiconductors.
ASJC Scopus Sachgebiete
- Informatik (insg.)
- Hardware und Architektur
- Energie (insg.)
- Energieanlagenbau und Kraftwerkstechnik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
Zitieren
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- BibTex
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ICPE 2023-ECCE Asia - 11th International Conference on Power Electronics - ECCE Asia. Institute of Electrical and Electronics Engineers Inc., 2023. S. 3224-3229 (International Conference on Power Electronics).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Implementation and Validation of a Long-Term Measurement System for Single Event Burnout at High Altitude
AU - Beckemeier, C.
AU - Fauth, L.
AU - Friebe, J.
N1 - Funding Information: VIII. ACKNOWLEDGEMENT We would like to acknowledge the funding by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) under Germany´s Excellence Strategy – EXC 2163/1 - Sustainable and Energy Efficient Aviation – Project-ID 390881007 and also by the Project-ID 502998206.
PY - 2023
Y1 - 2023
N2 - In electrified aircraft, cosmic radiation can be a potential hazard to power electronic systems like drive train inverters and dc/dc converters. As the increased failure rate at high altitudes usually requires a voltage derating, a detailed knowledge on the failure rate of the individual power semiconductors is necessary to enable an optimal compromise between failure rate and power density. This data is usually gained by accelerated measurements, which could omit certain influences of the high altitude. Therefore, this paper presents the implementation of a fully automatic long-term measurement system for the determination of the failure rate due to single event burnout under real conditions for power semiconductors.
AB - In electrified aircraft, cosmic radiation can be a potential hazard to power electronic systems like drive train inverters and dc/dc converters. As the increased failure rate at high altitudes usually requires a voltage derating, a detailed knowledge on the failure rate of the individual power semiconductors is necessary to enable an optimal compromise between failure rate and power density. This data is usually gained by accelerated measurements, which could omit certain influences of the high altitude. Therefore, this paper presents the implementation of a fully automatic long-term measurement system for the determination of the failure rate due to single event burnout under real conditions for power semiconductors.
KW - Cosmic Radiation
KW - Electric Aircraft
KW - Measurement System
KW - Power Devices (Si / Wide Band Gap)
KW - Reliability
KW - Single Event Effect
UR - http://www.scopus.com/inward/record.url?scp=85170642606&partnerID=8YFLogxK
U2 - 10.23919/ICPE2023-ECCEAsia54778.2023.10213780
DO - 10.23919/ICPE2023-ECCEAsia54778.2023.10213780
M3 - Conference contribution
AN - SCOPUS:85170642606
SN - 979-8-3503-3620-7
T3 - International Conference on Power Electronics
SP - 3224
EP - 3229
BT - ICPE 2023-ECCE Asia - 11th International Conference on Power Electronics - ECCE Asia
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th International Conference on Power Electronics - ECCE Asia, ICPE 2023-ECCE Asia
Y2 - 22 May 2023 through 25 May 2023
ER -