Impact of multistress aging on the dielectric relaxation behaviour of XLPE cable insulation

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autorschaft

  • M. Reuter
  • E. Gockenbach
  • H. Borsi
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OriginalspracheEnglisch
Titel des SammelwerksProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
Seiten339-342
Seitenumfang4
Band1
PublikationsstatusVeröffentlicht - 2004
Veranstaltung2004 IEEE International Conference on Solid Dielectrics ICSD 2004 - Toulouse, Frankreich
Dauer: 5 Juli 20049 Juli 2004

Abstract

This contribution reports on experimental investigations dealing with the impact of different combined aging parameters like electrical field strength, conductor temperature, and test duration on the dielectric relaxation behaviour of full-sized model cables with cross-linked polyethylene insulation. The evaluation of time-domain isothermal depolarisation current measurements turns out that characteristic properties of a third order exponential decay function exhibit different trends depending on the nature of the various aging factors.

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Impact of multistress aging on the dielectric relaxation behaviour of XLPE cable insulation. / Reuter, M.; Gockenbach, E.; Borsi, H.
Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004. Band 1 2004. S. 339-342.

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Reuter, M, Gockenbach, E & Borsi, H 2004, Impact of multistress aging on the dielectric relaxation behaviour of XLPE cable insulation. in Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004. Bd. 1, S. 339-342, 2004 IEEE International Conference on Solid Dielectrics ICSD 2004, Toulouse, Frankreich, 5 Juli 2004.
Reuter, M., Gockenbach, E., & Borsi, H. (2004). Impact of multistress aging on the dielectric relaxation behaviour of XLPE cable insulation. In Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004 (Band 1, S. 339-342)
Reuter M, Gockenbach E, Borsi H. Impact of multistress aging on the dielectric relaxation behaviour of XLPE cable insulation. in Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004. Band 1. 2004. S. 339-342
Reuter, M. ; Gockenbach, E. ; Borsi, H. / Impact of multistress aging on the dielectric relaxation behaviour of XLPE cable insulation. Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004. Band 1 2004. S. 339-342
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abstract = "This contribution reports on experimental investigations dealing with the impact of different combined aging parameters like electrical field strength, conductor temperature, and test duration on the dielectric relaxation behaviour of full-sized model cables with cross-linked polyethylene insulation. The evaluation of time-domain isothermal depolarisation current measurements turns out that characteristic properties of a third order exponential decay function exhibit different trends depending on the nature of the various aging factors.",
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