Impact of contacting geometries on measured fill factors

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Autoren

  • Christian N. Kruse
  • Martin Wolf
  • Carsten Schinke
  • David Hinken
  • Rolf Brendel
  • Karsten Bothe

Organisationseinheiten

Externe Organisationen

  • Institut für Solarenergieforschung GmbH (ISFH)
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Details

OriginalspracheEnglisch
Seiten (von - bis)84-90
Seitenumfang7
FachzeitschriftEnergy Procedia
Jahrgang124
PublikationsstatusVeröffentlicht - 21 Sept. 2017
Veranstaltung7th International Conference on Silicon Photovoltaics, SiliconPV 2017 - Freiburg, Deutschland
Dauer: 3 Apr. 20175 Apr. 2017

Abstract

The fill factor determined from a measured current-voltage characteristic of a bare solar cell depends on the number and positions of the electrical contacting probes. Nine different geometries for contacting the front side busbars are used to measure the current-voltage (I-V) characteristics of a 5 busbar industrial-type passivated emitter and rear totally diffused (PERT) solar cell under standard testing conditions. The fill factors of the measured I-V characteristics vary from 78.5 %abs to 80.6 %abs. We further measure the contacting resistance of 3 different contacting probes to estimate the sensitivity of measurements with different contacting geometries on random resistance variations. The contacting resistance is 60 mΩ for nine-point probes and 80 mΩ for four- and single-point probes. We determine the magnitude of contacting resistance variations from measurements at different probe positions to be ±30 mΩ. Using this variation, we perform numerical simulations and find a larger sensitivity on random resistance variations for tandem- (pairs of current- and sense probes) compared to triplet (one sense- between two current probes) configurations. The corresponding fill factor deviation is approximately 0.1%abs for tandem configurations when the contacting resistances of up to two current probes are altered. The sensitivity for triplet configurations is negligible.

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Impact of contacting geometries on measured fill factors. / Kruse, Christian N.; Wolf, Martin; Schinke, Carsten et al.
in: Energy Procedia, Jahrgang 124, 21.09.2017, S. 84-90.

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Kruse, CN, Wolf, M, Schinke, C, Hinken, D, Brendel, R & Bothe, K 2017, 'Impact of contacting geometries on measured fill factors', Energy Procedia, Jg. 124, S. 84-90. https://doi.org/10.1016/j.egypro.2017.09.329
Kruse, C. N., Wolf, M., Schinke, C., Hinken, D., Brendel, R., & Bothe, K. (2017). Impact of contacting geometries on measured fill factors. Energy Procedia, 124, 84-90. https://doi.org/10.1016/j.egypro.2017.09.329
Kruse CN, Wolf M, Schinke C, Hinken D, Brendel R, Bothe K. Impact of contacting geometries on measured fill factors. Energy Procedia. 2017 Sep 21;124:84-90. doi: 10.1016/j.egypro.2017.09.329
Kruse, Christian N. ; Wolf, Martin ; Schinke, Carsten et al. / Impact of contacting geometries on measured fill factors. in: Energy Procedia. 2017 ; Jahrgang 124. S. 84-90.
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T1 - Impact of contacting geometries on measured fill factors

AU - Kruse, Christian N.

AU - Wolf, Martin

AU - Schinke, Carsten

AU - Hinken, David

AU - Brendel, Rolf

AU - Bothe, Karsten

N1 - Publisher Copyright: © 2017 The Authors. Published by Elsevier Ltd. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.

PY - 2017/9/21

Y1 - 2017/9/21

N2 - The fill factor determined from a measured current-voltage characteristic of a bare solar cell depends on the number and positions of the electrical contacting probes. Nine different geometries for contacting the front side busbars are used to measure the current-voltage (I-V) characteristics of a 5 busbar industrial-type passivated emitter and rear totally diffused (PERT) solar cell under standard testing conditions. The fill factors of the measured I-V characteristics vary from 78.5 %abs to 80.6 %abs. We further measure the contacting resistance of 3 different contacting probes to estimate the sensitivity of measurements with different contacting geometries on random resistance variations. The contacting resistance is 60 mΩ for nine-point probes and 80 mΩ for four- and single-point probes. We determine the magnitude of contacting resistance variations from measurements at different probe positions to be ±30 mΩ. Using this variation, we perform numerical simulations and find a larger sensitivity on random resistance variations for tandem- (pairs of current- and sense probes) compared to triplet (one sense- between two current probes) configurations. The corresponding fill factor deviation is approximately 0.1%abs for tandem configurations when the contacting resistances of up to two current probes are altered. The sensitivity for triplet configurations is negligible.

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