Details
| Originalsprache | Englisch |
|---|---|
| Aufsatznummer | 153002 |
| Fachzeitschrift | Physical review letters |
| Jahrgang | 102 |
| Ausgabenummer | 15 |
| Publikationsstatus | Veröffentlicht - 16 Apr. 2009 |
| Extern publiziert | Ja |
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Allgemeine Physik und Astronomie
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High-fidelity transport of trapped-ion qubits through an X-junction trap array. / Blakestad, R. B.; Ospelkaus, C.; Vandevender, A. P. et al.
in: Physical review letters, Jahrgang 102, Nr. 15, 153002, 16.04.2009.
in: Physical review letters, Jahrgang 102, Nr. 15, 153002, 16.04.2009.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
Blakestad, RB, Ospelkaus, C, Vandevender, AP, Amini, JM, Britton, J, Leibfried, D & Wineland, DJ 2009, 'High-fidelity transport of trapped-ion qubits through an X-junction trap array', Physical review letters, Jg. 102, Nr. 15, 153002. https://doi.org/10.1103/PhysRevLett.102.153002
Blakestad, R. B., Ospelkaus, C., Vandevender, A. P., Amini, J. M., Britton, J., Leibfried, D., & Wineland, D. J. (2009). High-fidelity transport of trapped-ion qubits through an X-junction trap array. Physical review letters, 102(15), Artikel 153002. https://doi.org/10.1103/PhysRevLett.102.153002
Blakestad RB, Ospelkaus C, Vandevender AP, Amini JM, Britton J, Leibfried D et al. High-fidelity transport of trapped-ion qubits through an X-junction trap array. Physical review letters. 2009 Apr 16;102(15):153002. doi: 10.1103/PhysRevLett.102.153002
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AU - Blakestad, R. B.
AU - Ospelkaus, C.
AU - Vandevender, A. P.
AU - Amini, J. M.
AU - Britton, J.
AU - Leibfried, D.
AU - Wineland, D. J.
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JF - Physical review letters
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