High mobility solution processed MoS2 thin film transistors

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • Francis Oliver Vinay Gomes
  • Anuj Pokle
  • Marko Marinkovic
  • Torsten Balster
  • Ralf Anselmann
  • Valeria Nicolosi
  • Veit Wagner

Externe Organisationen

  • Constructor University Bremen
  • Trinity College Dublin
  • Evonik Resource Efficiency GmbH
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Seiten (von - bis)75-84
Seitenumfang10
FachzeitschriftSolid-State Electronics
Jahrgang158
Frühes Online-Datum20 Mai 2019
PublikationsstatusVeröffentlicht - Aug. 2019
Extern publiziertJa

Abstract

A simple wet-chemical synthesis of layered MoS2 thin films on sapphire is reported. The gap in understanding solution processed MoS2 deposition needs to be closed to exploit all its excellent properties for low-cost applications. In this work, as deposited Mo-precursor thin films were prepared based on the solubility and coating properties of Molybdenum(V)chloride in 1-Methoxy-2-propanol. Subsequent annealing of the deposited amorphous Mo-precursor films in the presence of sulfur resulted in the formation of highly crystalline layered MoS2 films on sapphire. Improved crystallinity of the deposited films was achieved by increasing the process temperature and performing the post-annealing treatment. Post-annealing at temperatures above 900 °C increased the uniformity of multilayer films, together with the increase of MoS2 grain size. For charge transport analysis, top-gate top-contact thin film transistors (TFTs)based on these solution processed MoS2 films were fabricated. Ionic liquid gating of the TFT devices exhibited n-type semiconducting behaviour with field-effect mobility as high as 12.07 cm2/Vs and Ion/off ratio ∼ 106. X-ray photoelectron spectroscopy measurements revealed that the films annealed between 900 °C and 980 °C had an average chemical composition of S/Mo ∼ 1.84. This facile liquid phase synthesis method with centimeter-scale uniformity and controllable film thickness up to 1.2 ± 0.65 nm is suitable for low-cost preparation of other transition metal dichalcogenides thin films in next-generation electronics.

ASJC Scopus Sachgebiete

Zitieren

High mobility solution processed MoS2 thin film transistors. / Gomes, Francis Oliver Vinay; Pokle, Anuj; Marinkovic, Marko et al.
in: Solid-State Electronics, Jahrgang 158, 08.2019, S. 75-84.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Gomes, FOV, Pokle, A, Marinkovic, M, Balster, T, Anselmann, R, Nicolosi, V & Wagner, V 2019, 'High mobility solution processed MoS2 thin film transistors', Solid-State Electronics, Jg. 158, S. 75-84. https://doi.org/10.1016/j.sse.2019.05.011
Gomes, F. O. V., Pokle, A., Marinkovic, M., Balster, T., Anselmann, R., Nicolosi, V., & Wagner, V. (2019). High mobility solution processed MoS2 thin film transistors. Solid-State Electronics, 158, 75-84. https://doi.org/10.1016/j.sse.2019.05.011
Gomes FOV, Pokle A, Marinkovic M, Balster T, Anselmann R, Nicolosi V et al. High mobility solution processed MoS2 thin film transistors. Solid-State Electronics. 2019 Aug;158:75-84. Epub 2019 Mai 20. doi: 10.1016/j.sse.2019.05.011
Gomes, Francis Oliver Vinay ; Pokle, Anuj ; Marinkovic, Marko et al. / High mobility solution processed MoS2 thin film transistors. in: Solid-State Electronics. 2019 ; Jahrgang 158. S. 75-84.
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title = "High mobility solution processed MoS2 thin film transistors",
abstract = "A simple wet-chemical synthesis of layered MoS2 thin films on sapphire is reported. The gap in understanding solution processed MoS2 deposition needs to be closed to exploit all its excellent properties for low-cost applications. In this work, as deposited Mo-precursor thin films were prepared based on the solubility and coating properties of Molybdenum(V)chloride in 1-Methoxy-2-propanol. Subsequent annealing of the deposited amorphous Mo-precursor films in the presence of sulfur resulted in the formation of highly crystalline layered MoS2 films on sapphire. Improved crystallinity of the deposited films was achieved by increasing the process temperature and performing the post-annealing treatment. Post-annealing at temperatures above 900 °C increased the uniformity of multilayer films, together with the increase of MoS2 grain size. For charge transport analysis, top-gate top-contact thin film transistors (TFTs)based on these solution processed MoS2 films were fabricated. Ionic liquid gating of the TFT devices exhibited n-type semiconducting behaviour with field-effect mobility as high as 12.07 cm2/Vs and Ion/off ratio ∼ 106. X-ray photoelectron spectroscopy measurements revealed that the films annealed between 900 °C and 980 °C had an average chemical composition of S/Mo ∼ 1.84. This facile liquid phase synthesis method with centimeter-scale uniformity and controllable film thickness up to 1.2 ± 0.65 nm is suitable for low-cost preparation of other transition metal dichalcogenides thin films in next-generation electronics.",
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T1 - High mobility solution processed MoS2 thin film transistors

AU - Gomes, Francis Oliver Vinay

AU - Pokle, Anuj

AU - Marinkovic, Marko

AU - Balster, Torsten

AU - Anselmann, Ralf

AU - Nicolosi, Valeria

AU - Wagner, Veit

N1 - Funding Information: This work was supported by the Marie Curie ITN network “MoWSeS” (Grant No. 317451 , 2013-2017).

PY - 2019/8

Y1 - 2019/8

N2 - A simple wet-chemical synthesis of layered MoS2 thin films on sapphire is reported. The gap in understanding solution processed MoS2 deposition needs to be closed to exploit all its excellent properties for low-cost applications. In this work, as deposited Mo-precursor thin films were prepared based on the solubility and coating properties of Molybdenum(V)chloride in 1-Methoxy-2-propanol. Subsequent annealing of the deposited amorphous Mo-precursor films in the presence of sulfur resulted in the formation of highly crystalline layered MoS2 films on sapphire. Improved crystallinity of the deposited films was achieved by increasing the process temperature and performing the post-annealing treatment. Post-annealing at temperatures above 900 °C increased the uniformity of multilayer films, together with the increase of MoS2 grain size. For charge transport analysis, top-gate top-contact thin film transistors (TFTs)based on these solution processed MoS2 films were fabricated. Ionic liquid gating of the TFT devices exhibited n-type semiconducting behaviour with field-effect mobility as high as 12.07 cm2/Vs and Ion/off ratio ∼ 106. X-ray photoelectron spectroscopy measurements revealed that the films annealed between 900 °C and 980 °C had an average chemical composition of S/Mo ∼ 1.84. This facile liquid phase synthesis method with centimeter-scale uniformity and controllable film thickness up to 1.2 ± 0.65 nm is suitable for low-cost preparation of other transition metal dichalcogenides thin films in next-generation electronics.

AB - A simple wet-chemical synthesis of layered MoS2 thin films on sapphire is reported. The gap in understanding solution processed MoS2 deposition needs to be closed to exploit all its excellent properties for low-cost applications. In this work, as deposited Mo-precursor thin films were prepared based on the solubility and coating properties of Molybdenum(V)chloride in 1-Methoxy-2-propanol. Subsequent annealing of the deposited amorphous Mo-precursor films in the presence of sulfur resulted in the formation of highly crystalline layered MoS2 films on sapphire. Improved crystallinity of the deposited films was achieved by increasing the process temperature and performing the post-annealing treatment. Post-annealing at temperatures above 900 °C increased the uniformity of multilayer films, together with the increase of MoS2 grain size. For charge transport analysis, top-gate top-contact thin film transistors (TFTs)based on these solution processed MoS2 films were fabricated. Ionic liquid gating of the TFT devices exhibited n-type semiconducting behaviour with field-effect mobility as high as 12.07 cm2/Vs and Ion/off ratio ∼ 106. X-ray photoelectron spectroscopy measurements revealed that the films annealed between 900 °C and 980 °C had an average chemical composition of S/Mo ∼ 1.84. This facile liquid phase synthesis method with centimeter-scale uniformity and controllable film thickness up to 1.2 ± 0.65 nm is suitable for low-cost preparation of other transition metal dichalcogenides thin films in next-generation electronics.

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KW - Molybdenum disulfide

KW - Semiconductor

KW - Solution process

KW - Thin film transistors

KW - Two-dimensional (2D)material

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VL - 158

SP - 75

EP - 84

JO - Solid-State Electronics

JF - Solid-State Electronics

SN - 0038-1101

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