Frequency dependence of dielectrophoretic fabrication of single-walled carbon nanotube field-effect transistors

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • Yousef Adeli Sadabad
  • Amirreza Khodadadian
  • Kiarash Hosseini Istadeh
  • Marjan Hedayati
  • Reza Kalantarinejad
  • Clemens Heitzinger

Organisationseinheiten

Externe Organisationen

  • Shezan Research and Innovation Center
  • Technische Universität Wien (TUW)
  • Arizona State University
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Details

OriginalspracheEnglisch
Seiten (von - bis)1516-1526
Seitenumfang11
FachzeitschriftJournal of Computational Electronics
Jahrgang19
Ausgabenummer4
Frühes Online-Datum10 Aug. 2020
PublikationsstatusVeröffentlicht - Dez. 2020

Abstract

A new theoretical model for the dielectrophoretic (DEP) fabrication of single-walled carbon nanotubes (SWCNTs) is presented. A different frequency interval for the alignment of wide-energy-gap semiconductor SWCNTs is obtained, exhibiting a considerable difference from the prevalent model. Two specific models are study, namely the spherical model and the ellipsoid model, to estimate the frequency interval. Then, the DEP process is performed and the obtained frequencies (from the spherical and ellipsoid models) are used to align the SWCNTs. These empirical results confirm the theoretical predictions, representing a crucial step towards the realization of carbon nanotube field-effect transistors (CNT-FETs) via the DEP process based on the ellipsoid model.

ASJC Scopus Sachgebiete

Zitieren

Frequency dependence of dielectrophoretic fabrication of single-walled carbon nanotube field-effect transistors. / Sadabad, Yousef Adeli; Khodadadian, Amirreza; Istadeh, Kiarash Hosseini et al.
in: Journal of Computational Electronics, Jahrgang 19, Nr. 4, 12.2020, S. 1516-1526.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Sadabad YA, Khodadadian A, Istadeh KH, Hedayati M, Kalantarinejad R, Heitzinger C. Frequency dependence of dielectrophoretic fabrication of single-walled carbon nanotube field-effect transistors. Journal of Computational Electronics. 2020 Dez;19(4):1516-1526. Epub 2020 Aug 10. doi: 10.1007/s10825-020-01562-x, 10.15488/12613
Sadabad, Yousef Adeli ; Khodadadian, Amirreza ; Istadeh, Kiarash Hosseini et al. / Frequency dependence of dielectrophoretic fabrication of single-walled carbon nanotube field-effect transistors. in: Journal of Computational Electronics. 2020 ; Jahrgang 19, Nr. 4. S. 1516-1526.
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title = "Frequency dependence of dielectrophoretic fabrication of single-walled carbon nanotube field-effect transistors",
abstract = "A new theoretical model for the dielectrophoretic (DEP) fabrication of single-walled carbon nanotubes (SWCNTs) is presented. A different frequency interval for the alignment of wide-energy-gap semiconductor SWCNTs is obtained, exhibiting a considerable difference from the prevalent model. Two specific models are study, namely the spherical model and the ellipsoid model, to estimate the frequency interval. Then, the DEP process is performed and the obtained frequencies (from the spherical and ellipsoid models) are used to align the SWCNTs. These empirical results confirm the theoretical predictions, representing a crucial step towards the realization of carbon nanotube field-effect transistors (CNT-FETs) via the DEP process based on the ellipsoid model.",
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Download

TY - JOUR

T1 - Frequency dependence of dielectrophoretic fabrication of single-walled carbon nanotube field-effect transistors

AU - Sadabad, Yousef Adeli

AU - Khodadadian, Amirreza

AU - Istadeh, Kiarash Hosseini

AU - Hedayati, Marjan

AU - Kalantarinejad, Reza

AU - Heitzinger, Clemens

N1 - Funding Information: Open access funding provided by Austrian Science Fund (FWF). A.K. and C.H. acknowledge financial support given by the FWF (Austrian Science Fund) START Project No. Y660 (PDE Models for Nanotechnology).

PY - 2020/12

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N2 - A new theoretical model for the dielectrophoretic (DEP) fabrication of single-walled carbon nanotubes (SWCNTs) is presented. A different frequency interval for the alignment of wide-energy-gap semiconductor SWCNTs is obtained, exhibiting a considerable difference from the prevalent model. Two specific models are study, namely the spherical model and the ellipsoid model, to estimate the frequency interval. Then, the DEP process is performed and the obtained frequencies (from the spherical and ellipsoid models) are used to align the SWCNTs. These empirical results confirm the theoretical predictions, representing a crucial step towards the realization of carbon nanotube field-effect transistors (CNT-FETs) via the DEP process based on the ellipsoid model.

AB - A new theoretical model for the dielectrophoretic (DEP) fabrication of single-walled carbon nanotubes (SWCNTs) is presented. A different frequency interval for the alignment of wide-energy-gap semiconductor SWCNTs is obtained, exhibiting a considerable difference from the prevalent model. Two specific models are study, namely the spherical model and the ellipsoid model, to estimate the frequency interval. Then, the DEP process is performed and the obtained frequencies (from the spherical and ellipsoid models) are used to align the SWCNTs. These empirical results confirm the theoretical predictions, representing a crucial step towards the realization of carbon nanotube field-effect transistors (CNT-FETs) via the DEP process based on the ellipsoid model.

KW - Dielectrophoresis

KW - Ellipsoid model

KW - Single-walled carbon nanotube

KW - Spherical model

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