Formation of Si twinning-superlattice: First step towards Si polytype growth

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • A. Fissel
  • E. Bugiel
  • C. R. Wang
  • H. J. Osten
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Details

OriginalspracheEnglisch
Seiten (von - bis)138-141
Seitenumfang4
FachzeitschriftMaterials Science and Engineering B: Solid-State Materials for Advanced Technology
Jahrgang134
Ausgabenummer2-3 SPEC. ISS.
Frühes Online-Datum21 Aug. 2006
PublikationsstatusVeröffentlicht - 15 Okt. 2006

Abstract

We report about the formation of twinning-superlattice regions in Si epitaxial layers grown by multi-step molecular beam epitaxy on Si (1 1 1) (sqrt(3) × sqrt(3)) R 30{ring operator}-B surfaces in which boron acts as a subsurfactant. Twinning-superlattice regions were formed by periodical arrangement of 180° rotation twins along the [1 1 1] direction separated by a few nanometers. The multi-step procedure consists of repeating several growth, boron deposition and annealing cycles on boron-predeposited undoped Si substrates. It is shown that the amount of subsurface boron and the growth mode influence the formation of twin boundaries. Only the nucleation of Si on the Si (1 1 1) (sqrt(3) × sqrt(3)) R 30{ring operator}-surface covered by at least 1/3 ML subsurface boron results in the formation of 180° rotation twins. The presented technology should be suitable to prepare Si polytypes.

ASJC Scopus Sachgebiete

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Formation of Si twinning-superlattice: First step towards Si polytype growth. / Fissel, A.; Bugiel, E.; Wang, C. R. et al.
in: Materials Science and Engineering B: Solid-State Materials for Advanced Technology, Jahrgang 134, Nr. 2-3 SPEC. ISS., 15.10.2006, S. 138-141.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Fissel A, Bugiel E, Wang CR, Osten HJ. Formation of Si twinning-superlattice: First step towards Si polytype growth. Materials Science and Engineering B: Solid-State Materials for Advanced Technology. 2006 Okt 15;134(2-3 SPEC. ISS.):138-141. Epub 2006 Aug 21. doi: 10.1016/j.mseb.2006.06.046
Fissel, A. ; Bugiel, E. ; Wang, C. R. et al. / Formation of Si twinning-superlattice : First step towards Si polytype growth. in: Materials Science and Engineering B: Solid-State Materials for Advanced Technology. 2006 ; Jahrgang 134, Nr. 2-3 SPEC. ISS. S. 138-141.
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AU - Fissel, A.

AU - Bugiel, E.

AU - Wang, C. R.

AU - Osten, H. J.

N1 - Funding Information: The authors acknowledge the financial support of the Deutsche Forschungsgemeinschaft (DFG Project FI 726/3-1). Furthermore, the authors also like to thank Michael Seibt from the university of Göttingen for using the TEM equipment.

PY - 2006/10/15

Y1 - 2006/10/15

N2 - We report about the formation of twinning-superlattice regions in Si epitaxial layers grown by multi-step molecular beam epitaxy on Si (1 1 1) (sqrt(3) × sqrt(3)) R 30{ring operator}-B surfaces in which boron acts as a subsurfactant. Twinning-superlattice regions were formed by periodical arrangement of 180° rotation twins along the [1 1 1] direction separated by a few nanometers. The multi-step procedure consists of repeating several growth, boron deposition and annealing cycles on boron-predeposited undoped Si substrates. It is shown that the amount of subsurface boron and the growth mode influence the formation of twin boundaries. Only the nucleation of Si on the Si (1 1 1) (sqrt(3) × sqrt(3)) R 30{ring operator}-surface covered by at least 1/3 ML subsurface boron results in the formation of 180° rotation twins. The presented technology should be suitable to prepare Si polytypes.

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KW - Silicon

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KW - Twinning

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