Details
Originalsprache | Englisch |
---|---|
Titel des Sammelwerks | 2017 27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS) |
Untertitel | Proceedings |
Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
Seiten | 1-8 |
Seitenumfang | 8 |
ISBN (elektronisch) | 978-1-5090-6462-5 |
ISBN (Print) | 978-1-5090-6463-2 |
Publikationsstatus | Veröffentlicht - Sept. 2017 |
Veranstaltung | 27th International Symposium on Power and Timing Modeling, Optimization and Simulation, PATMOS 2017 - Thessaloniki, Griechenland Dauer: 25 Sept. 2017 → 27 Sept. 2017 |
Abstract
ASJC Scopus Sachgebiete
- Mathematik (insg.)
- Modellierung und Simulation
- Informatik (insg.)
- Computernetzwerke und -kommunikation
- Informatik (insg.)
- Hardware und Architektur
- Energie (insg.)
- Energieanlagenbau und Kraftwerkstechnik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
- Mathematik (insg.)
- Steuerung und Optimierung
Ziele für nachhaltige Entwicklung
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- BibTex
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2017 27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS): Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. S. 1-8.
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - FLINT+
T2 - 27th International Symposium on Power and Timing Modeling, Optimization and Simulation, PATMOS 2017
AU - Weißbrich, Moritz
AU - Payá-Vayá, Guillermo
AU - Gerlach, Lukas
AU - Blume, Holger
AU - Najafi, A.
AU - García-Ortiz, A.
N1 - Funding information: This work was partly funded by the German Research Council (DFG) under project number PA 2762/1-1.
PY - 2017/9
Y1 - 2017/9
N2 - ASICs for Stochastic Computing conditions are designed for higher energy-efficiency or performance by sacrificing computational accuracy due to intentional circuit timing violations. To optimize the stochastic gate-level circuit behavior of a specific design, iterative timing analysis campaigns have to be carried out for a variety of chip temperature- and supply voltage-dependent timing corner cases. However, the application of common event-driven logic simulators usually leads to excessive analysis runtimes, increasing design time for hardware developers. In this paper, a gate-level netlist-oriented FPGA-based timing analysis framework is proposed, offering a runtime-configuration mechanism for emulating different timing corner cases in hardware without requiring multiple FPGA bitstreams. For an exemplary timing analysis campaign of an existing chip design, speed-up factors of up to 267 are achieved while maintaining timing behavior deviations lower than 1.05% to timing simulations.
AB - ASICs for Stochastic Computing conditions are designed for higher energy-efficiency or performance by sacrificing computational accuracy due to intentional circuit timing violations. To optimize the stochastic gate-level circuit behavior of a specific design, iterative timing analysis campaigns have to be carried out for a variety of chip temperature- and supply voltage-dependent timing corner cases. However, the application of common event-driven logic simulators usually leads to excessive analysis runtimes, increasing design time for hardware developers. In this paper, a gate-level netlist-oriented FPGA-based timing analysis framework is proposed, offering a runtime-configuration mechanism for emulating different timing corner cases in hardware without requiring multiple FPGA bitstreams. For an exemplary timing analysis campaign of an existing chip design, speed-up factors of up to 267 are achieved while maintaining timing behavior deviations lower than 1.05% to timing simulations.
UR - http://www.scopus.com/inward/record.url?scp=85043467254&partnerID=8YFLogxK
U2 - 10.1109/PATMOS.2017.8106956
DO - 10.1109/PATMOS.2017.8106956
M3 - Conference contribution
AN - SCOPUS:85043467254
SN - 978-1-5090-6463-2
SP - 1
EP - 8
BT - 2017 27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 25 September 2017 through 27 September 2017
ER -