Flashover Voltage Dependence of the Tangential Field Strength of Contaminated Insulator Surfaces in SF6

Publikation: Konferenzbeitrag › Paper › Forschung › Peer-Review

Autoren

  • R. Brockmann
  • R. v. Ohlshausen

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OriginalspracheEnglisch
PublikationsstatusVeröffentlicht - 1982

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Flashover Voltage Dependence of the Tangential Field Strength of Contaminated Insulator Surfaces in SF6. / Brockmann, R.; Ohlshausen , R. v.
1982.

Publikation: Konferenzbeitrag › Paper › Forschung › Peer-Review

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title = "Flashover Voltage Dependence of the Tangential Field Strength of Contaminated Insulator Surfaces in SF6",
author = "R. Brockmann and Ohlshausen, {R. v.}",
year = "1982",
language = "English",

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AU - Brockmann, R.

AU - Ohlshausen , R. v.

PY - 1982

Y1 - 1982

M3 - Paper

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