Femtosecond pulse damage and pre-damage behavior of dielectric thin films

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review

Autoren

  • Mark Mero
  • Jianhua Liu
  • Ali Sabbah
  • Jayesh Jasapara
  • Kai Starke
  • Detlev Ristau
  • John K. Mclver
  • Wolfgang Rudolph

Externe Organisationen

  • University of New Mexico
  • OFS Laboratories
  • Laser Zentrum Hannover e.V. (LZH)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des SammelwerksLaser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
ErscheinungsortBellingham
Herausgeber (Verlag)SPIE
Seiten202-215
Seitenumfang14
ISBN (Print)0-8194-4727-7
PublikationsstatusVeröffentlicht - 30 Mai 2003
Extern publiziertJa
VeranstaltungLaser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization - Boulder, CO, USA / Vereinigte Staaten
Dauer: 16 Sept. 2002 → 18 Sept. 2002

Publikationsreihe

NameProceedings of SPIE - The International Society for Optical Engineering
Herausgeber (Verlag)SPIE
Band4932
ISSN (Print)0277-786X

Abstract

The damage behavior of five different oxide dielectric thin films (Ta 2O5, TiO22, Al2O23, HfO2, and SiO2) has been investigated with ultrashort laser pulses with durations from 25 fs to 1 ps. At all pulse durations the damage threshold is well defined and scales with the bandgap energy of the material. The damage behavior can be described with a phenomenological model taking into account multi-photon excitation, impact ionization, and electron relaxation. The temporal evolution of the dielectric constant of the film following the excitation with pulses below the damage threshold has been measured with time-resolved pump-probe spectroscopy. The complex dielectric constant was retrieved from transient reflection and transmission data.

ASJC Scopus Sachgebiete

Zitieren

Femtosecond pulse damage and pre-damage behavior of dielectric thin films. / Mero, Mark; Liu, Jianhua; Sabbah, Ali et al.
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. Bellingham: SPIE, 2003. S. 202-215 (Proceedings of SPIE - The International Society for Optical Engineering; Band 4932).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review

Mero, M, Liu, J, Sabbah, A, Jasapara, J, Starke, K, Ristau, D, Mclver, JK & Rudolph, W 2003, Femtosecond pulse damage and pre-damage behavior of dielectric thin films. in Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. Proceedings of SPIE - The International Society for Optical Engineering, Bd. 4932, SPIE, Bellingham, S. 202-215, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, Boulder, CO, USA / Vereinigte Staaten, 16 Sept. 2002. https://doi.org/10.1117/12.501361
Mero, M., Liu, J., Sabbah, A., Jasapara, J., Starke, K., Ristau, D., Mclver, J. K., & Rudolph, W. (2003). Femtosecond pulse damage and pre-damage behavior of dielectric thin films. In Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization (S. 202-215). (Proceedings of SPIE - The International Society for Optical Engineering; Band 4932). SPIE. https://doi.org/10.1117/12.501361
Mero M, Liu J, Sabbah A, Jasapara J, Starke K, Ristau D et al. Femtosecond pulse damage and pre-damage behavior of dielectric thin films. in Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. Bellingham: SPIE. 2003. S. 202-215. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.501361
Mero, Mark ; Liu, Jianhua ; Sabbah, Ali et al. / Femtosecond pulse damage and pre-damage behavior of dielectric thin films. Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. Bellingham : SPIE, 2003. S. 202-215 (Proceedings of SPIE - The International Society for Optical Engineering).
Download
@inproceedings{3f407b42efcb4afa82e4bf5bb2dc879f,
title = "Femtosecond pulse damage and pre-damage behavior of dielectric thin films",
abstract = "The damage behavior of five different oxide dielectric thin films (Ta 2O5, TiO22, Al2O23, HfO2, and SiO2) has been investigated with ultrashort laser pulses with durations from 25 fs to 1 ps. At all pulse durations the damage threshold is well defined and scales with the bandgap energy of the material. The damage behavior can be described with a phenomenological model taking into account multi-photon excitation, impact ionization, and electron relaxation. The temporal evolution of the dielectric constant of the film following the excitation with pulses below the damage threshold has been measured with time-resolved pump-probe spectroscopy. The complex dielectric constant was retrieved from transient reflection and transmission data.",
keywords = "Laser damage, Pump-probe spectroscopy, Thin films, Ultrafast processes",
author = "Mark Mero and Jianhua Liu and Ali Sabbah and Jayesh Jasapara and Kai Starke and Detlev Ristau and Mclver, {John K.} and Wolfgang Rudolph",
year = "2003",
month = may,
day = "30",
doi = "10.1117/12.501361",
language = "English",
isbn = "0-8194-4727-7",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
pages = "202--215",
booktitle = "Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization",
address = "United States",
note = "Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization ; Conference date: 16-09-2002 Through 18-09-2002",

}

Download

TY - GEN

T1 - Femtosecond pulse damage and pre-damage behavior of dielectric thin films

AU - Mero, Mark

AU - Liu, Jianhua

AU - Sabbah, Ali

AU - Jasapara, Jayesh

AU - Starke, Kai

AU - Ristau, Detlev

AU - Mclver, John K.

AU - Rudolph, Wolfgang

PY - 2003/5/30

Y1 - 2003/5/30

N2 - The damage behavior of five different oxide dielectric thin films (Ta 2O5, TiO22, Al2O23, HfO2, and SiO2) has been investigated with ultrashort laser pulses with durations from 25 fs to 1 ps. At all pulse durations the damage threshold is well defined and scales with the bandgap energy of the material. The damage behavior can be described with a phenomenological model taking into account multi-photon excitation, impact ionization, and electron relaxation. The temporal evolution of the dielectric constant of the film following the excitation with pulses below the damage threshold has been measured with time-resolved pump-probe spectroscopy. The complex dielectric constant was retrieved from transient reflection and transmission data.

AB - The damage behavior of five different oxide dielectric thin films (Ta 2O5, TiO22, Al2O23, HfO2, and SiO2) has been investigated with ultrashort laser pulses with durations from 25 fs to 1 ps. At all pulse durations the damage threshold is well defined and scales with the bandgap energy of the material. The damage behavior can be described with a phenomenological model taking into account multi-photon excitation, impact ionization, and electron relaxation. The temporal evolution of the dielectric constant of the film following the excitation with pulses below the damage threshold has been measured with time-resolved pump-probe spectroscopy. The complex dielectric constant was retrieved from transient reflection and transmission data.

KW - Laser damage

KW - Pump-probe spectroscopy

KW - Thin films

KW - Ultrafast processes

UR - http://www.scopus.com/inward/record.url?scp=0041861070&partnerID=8YFLogxK

U2 - 10.1117/12.501361

DO - 10.1117/12.501361

M3 - Conference contribution

AN - SCOPUS:0041861070

SN - 0-8194-4727-7

T3 - Proceedings of SPIE - The International Society for Optical Engineering

SP - 202

EP - 215

BT - Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization

PB - SPIE

CY - Bellingham

T2 - Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization

Y2 - 16 September 2002 through 18 September 2002

ER -