Femtosecond breakdown and pre-breakdown behavior in dielectric thin films

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review

Autoren

  • Mark Mero
  • Jianhua Liu
  • Ali J. Sabbah
  • Joachim Zeller
  • Wolfgang G. Rudolph
  • Kai Starke
  • Detlev Ristau

Externe Organisationen

  • University of New Mexico
  • Fudan University
  • Laser Zentrum Hannover e.V. (LZH)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des SammelwerksCommercial and Biomedical Applications of Ultrafast Lasers IV
Untertitel27 - 29 January 2004, San Jose, California, USA
ErscheinungsortBellingham
Herausgeber (Verlag)SPIE
Seiten133-145
Seitenumfang13
ISBN (Print)0-8194-5248-3
PublikationsstatusVeröffentlicht - 1 Juni 2004
Extern publiziertJa
VeranstaltungCommercial and Biomedical Applications of Ultrafast Lasers IV - San Jose, CA, USA / Vereinigte Staaten
Dauer: 27 Jan. 2004 → 29 Jan. 2004

Publikationsreihe

NameProceedings of SPIE - The International Society for Optical Engineering
Herausgeber (Verlag)SPIE
Band5340
ISSN (Print)0277-786X

Abstract

Dielectric oxide and fluoride films used for optical coatings are studied with femtosecond laser pulses with respect to their breakdown and pre-breakdown behavior. A phenomenological model with only three figures of merit is used to explain the measured breakdown thresholds for pulse durations from 25 fs to 1 ps. The temporal evolution of the dielectric constant in the pre-breakdown regime is obtained from transient reflection and transmission measurements after taking into account standing wave effects of pump and probe. In addition to electron-electron and electron-phonon scattering processes, the creation of a new sample state after a few hundred fs is observed. The experimental data are explained with a computer simulation based on the Boltzmann equation.

ASJC Scopus Sachgebiete

Zitieren

Femtosecond breakdown and pre-breakdown behavior in dielectric thin films. / Mero, Mark; Liu, Jianhua; Sabbah, Ali J. et al.
Commercial and Biomedical Applications of Ultrafast Lasers IV: 27 - 29 January 2004, San Jose, California, USA. Bellingham: SPIE, 2004. S. 133-145 (Proceedings of SPIE - The International Society for Optical Engineering; Band 5340).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review

Mero, M, Liu, J, Sabbah, AJ, Zeller, J, Rudolph, WG, Starke, K & Ristau, D 2004, Femtosecond breakdown and pre-breakdown behavior in dielectric thin films. in Commercial and Biomedical Applications of Ultrafast Lasers IV: 27 - 29 January 2004, San Jose, California, USA. Proceedings of SPIE - The International Society for Optical Engineering, Bd. 5340, SPIE, Bellingham, S. 133-145, Commercial and Biomedical Applications of Ultrafast Lasers IV, San Jose, CA, USA / Vereinigte Staaten, 27 Jan. 2004. https://doi.org/10.1117/12.538218
Mero, M., Liu, J., Sabbah, A. J., Zeller, J., Rudolph, W. G., Starke, K., & Ristau, D. (2004). Femtosecond breakdown and pre-breakdown behavior in dielectric thin films. In Commercial and Biomedical Applications of Ultrafast Lasers IV: 27 - 29 January 2004, San Jose, California, USA (S. 133-145). (Proceedings of SPIE - The International Society for Optical Engineering; Band 5340). SPIE. https://doi.org/10.1117/12.538218
Mero M, Liu J, Sabbah AJ, Zeller J, Rudolph WG, Starke K et al. Femtosecond breakdown and pre-breakdown behavior in dielectric thin films. in Commercial and Biomedical Applications of Ultrafast Lasers IV: 27 - 29 January 2004, San Jose, California, USA. Bellingham: SPIE. 2004. S. 133-145. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.538218
Mero, Mark ; Liu, Jianhua ; Sabbah, Ali J. et al. / Femtosecond breakdown and pre-breakdown behavior in dielectric thin films. Commercial and Biomedical Applications of Ultrafast Lasers IV: 27 - 29 January 2004, San Jose, California, USA. Bellingham : SPIE, 2004. S. 133-145 (Proceedings of SPIE - The International Society for Optical Engineering).
Download
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AU - Zeller, Joachim

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AU - Starke, Kai

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