Details
| Originalsprache | undefiniert/unbekannt |
|---|---|
| Titel des Sammelwerks | 2018 IEEE 2nd International Conference on Dielectrics (ICD) |
| Seiten | 1-6 |
| Seitenumfang | 6 |
| Publikationsstatus | Veröffentlicht - 2018 |
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Feasibility of FDA method for the detection and classification of faults in extruded HVDC cables. / Norouzi, Younes; Frohne, Christian; Gauler, Volker et al.
2018 IEEE 2nd International Conference on Dielectrics (ICD). 2018. S. 1-6.
2018 IEEE 2nd International Conference on Dielectrics (ICD). 2018. S. 1-6.
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
Norouzi, Y, Frohne, C, Gauler, V, Werle, P & Seifi, S 2018, Feasibility of FDA method for the detection and classification of faults in extruded HVDC cables. in 2018 IEEE 2nd International Conference on Dielectrics (ICD). S. 1-6.
Norouzi, Y., Frohne, C., Gauler, V., Werle, P., & Seifi, S. (2018). Feasibility of FDA method for the detection and classification of faults in extruded HVDC cables. In 2018 IEEE 2nd International Conference on Dielectrics (ICD) (S. 1-6)
Norouzi Y, Frohne C, Gauler V, Werle P, Seifi S. Feasibility of FDA method for the detection and classification of faults in extruded HVDC cables. in 2018 IEEE 2nd International Conference on Dielectrics (ICD). 2018. S. 1-6
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@inproceedings{2b761d687337482db3a4651195f0f1b5,
title = "Feasibility of FDA method for the detection and classification of faults in extruded HVDC cables",
author = "Younes Norouzi and Christian Frohne and Volker Gauler and Peter Werle and Sahand Seifi",
year = "2018",
language = "Undefined/Unknown",
pages = "1--6",
booktitle = "2018 IEEE 2nd International Conference on Dielectrics (ICD)",
}
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TY - GEN
T1 - Feasibility of FDA method for the detection and classification of faults in extruded HVDC cables
AU - Norouzi, Younes
AU - Frohne, Christian
AU - Gauler, Volker
AU - Werle, Peter
AU - Seifi, Sahand
PY - 2018
Y1 - 2018
M3 - Aufsatz in Konferenzband
SP - 1
EP - 6
BT - 2018 IEEE 2nd International Conference on Dielectrics (ICD)
ER -