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Fast in-situ tool inspection based on inverse fringe projection and compact sensor heads

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

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OriginalspracheEnglisch
Titel des SammelwerksOptical Metrology and Inspection for Industrial Applications IV
Herausgeber/-innenToru Yoshizawa, Sen Han, Song Zhang
Herausgeber (Verlag)SPIE
Seitenumfang9
ISBN (elektronisch)9781510604650
PublikationsstatusVeröffentlicht - 24 Nov. 2016
VeranstaltungConference on Optical Metrology and Inspection for Industrial Applications IV - Beijing, China
Dauer: 12 Okt. 201614 Okt. 2016

Publikationsreihe

NameProceedings of SPIE - The International Society for Optical Engineering
Band10023
ISSN (Print)0277-786X
ISSN (elektronisch)1996-756X

Abstract

Inspection of machine elements is an important task in production processes in order to ensure the quality of produced parts and to gather feedback for the continuous improvement process. A new measuring system is presented, which is capable of performing the inspection of critical tool geometries, such as gearing elements, inside the forming machine. To meet the constraints on sensor head size and inspection time imposed by the limited space inside the machine and the cycle time of the process, the measuring device employs a combination of endoscopy techniques with the fringe projection principle. Compact gradient index lenses enable a compact design of the sensor head, which is connected to a CMOS camera and a flexible micro-mirror based projector via flexible fiber bundles. Using common fringe projection patterns, the system achieves measuring times of less than five seconds. To further reduce the time required for inspection, the generation of inverse fringe projection patterns has been implemented for the system. Inverse fringe projection speeds up the inspection process by employing object-adapted patterns, which enable the detection of geometry deviations in a single image. Two different approaches to generate object adapted patterns are presented. The first approach uses a reference measurement of a manufactured tool master to generate the inverse pattern. The second approach is based on a virtual master geometry in the form of a CAD file and a ray-tracing model of the measuring system. Virtual modeling of the measuring device and inspection setup allows for geometric tolerancing for free-form surfaces by the tool designer in the CAD-file. A new approach is presented, which uses virtual tolerance specifications and additional simulation steps to enable fast checking of metric tolerances. Following the description of the pattern generation process, the image processing steps required for inspection are demonstrated on captures of gearing geometries.

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Fast in-situ tool inspection based on inverse fringe projection and compact sensor heads. / Matthias, Steffen; Kästner, Markus; Reithmeier, Eduard.
Optical Metrology and Inspection for Industrial Applications IV. Hrsg. / Toru Yoshizawa; Sen Han; Song Zhang. SPIE, 2016. 100230K (Proceedings of SPIE - The International Society for Optical Engineering; Band 10023).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Matthias, S, Kästner, M & Reithmeier, E 2016, Fast in-situ tool inspection based on inverse fringe projection and compact sensor heads. in T Yoshizawa, S Han & S Zhang (Hrsg.), Optical Metrology and Inspection for Industrial Applications IV., 100230K, Proceedings of SPIE - The International Society for Optical Engineering, Bd. 10023, SPIE, Conference on Optical Metrology and Inspection for Industrial Applications IV, Beijing, China, 12 Okt. 2016. https://doi.org/10.1117/12.2247482, https://doi.org/10.15488/1760
Matthias, S., Kästner, M., & Reithmeier, E. (2016). Fast in-situ tool inspection based on inverse fringe projection and compact sensor heads. In T. Yoshizawa, S. Han, & S. Zhang (Hrsg.), Optical Metrology and Inspection for Industrial Applications IV Artikel 100230K (Proceedings of SPIE - The International Society for Optical Engineering; Band 10023). SPIE. https://doi.org/10.1117/12.2247482, https://doi.org/10.15488/1760
Matthias S, Kästner M, Reithmeier E. Fast in-situ tool inspection based on inverse fringe projection and compact sensor heads. in Yoshizawa T, Han S, Zhang S, Hrsg., Optical Metrology and Inspection for Industrial Applications IV. SPIE. 2016. 100230K. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2247482, 10.15488/1760
Matthias, Steffen ; Kästner, Markus ; Reithmeier, Eduard. / Fast in-situ tool inspection based on inverse fringe projection and compact sensor heads. Optical Metrology and Inspection for Industrial Applications IV. Hrsg. / Toru Yoshizawa ; Sen Han ; Song Zhang. SPIE, 2016. (Proceedings of SPIE - The International Society for Optical Engineering).
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