Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 11th European Dependable Computing Conference |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| Seiten | 245-255 |
| Seitenumfang | 11 |
| ISBN (elektronisch) | 9781467392891 |
| Publikationsstatus | Veröffentlicht - 7 Jan. 2016 |
| Extern publiziert | Ja |
| Veranstaltung | 11th European Dependable Computing Conference, EDCC 2015 - Paris, Frankreich Dauer: 7 Sept. 2015 → 11 Sept. 2015 |
Abstract
Due to voltage and structure shrinking, the influence of radiation on a circuit's operation increases, resulting in future hardware designs exhibiting much higher rates of soft errors. Software developers have to cope with these effects to ensure functional safety. However, software-based hardware fault tolerance is a holistic property that is tricky to achieve in practice, potentially impaired by every single design decision. We present FAIL∗, an open and versatile architecture-level fault-injection (FI) framework for the continuous assessment and quantification of fault tolerance in an iterative software development process. FAIL∗ supplies the developer with reusable and composable FI campaigns, advanced pre-and post-processing analyses to easily identify sensitive spots in the software, well-abstracted back-end implementations for several hardware and simulator platforms, and scalability of FI campaigns by providing massive parallelization. We describe FAIL∗, its application to the development process of safety-critical software, and the lessons learned from a real-world example.
ASJC Scopus Sachgebiete
- Informatik (insg.)
- Computernetzwerke und -kommunikation
- Informatik (insg.)
- Hardware und Architektur
- Ingenieurwesen (insg.)
- Sicherheit, Risiko, Zuverlässigkeit und Qualität
Zitieren
- Standard
- Harvard
- Apa
- Vancouver
- BibTex
- RIS
11th European Dependable Computing Conference. Institute of Electrical and Electronics Engineers Inc., 2016. S. 245-255 7371972.
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - FAIL∗: An Open and Versatile Fault-Injection Framework for the Assessment of Software-Implemented Hardware Fault Tolerance
AU - Schirmeier, Horst
AU - Hoffmann, Martin
AU - Dietrich, Christian
AU - Lenz, Michael
AU - Lohmann, Daniel
AU - Spinczyk, Olaf
PY - 2016/1/7
Y1 - 2016/1/7
N2 - Due to voltage and structure shrinking, the influence of radiation on a circuit's operation increases, resulting in future hardware designs exhibiting much higher rates of soft errors. Software developers have to cope with these effects to ensure functional safety. However, software-based hardware fault tolerance is a holistic property that is tricky to achieve in practice, potentially impaired by every single design decision. We present FAIL∗, an open and versatile architecture-level fault-injection (FI) framework for the continuous assessment and quantification of fault tolerance in an iterative software development process. FAIL∗ supplies the developer with reusable and composable FI campaigns, advanced pre-and post-processing analyses to easily identify sensitive spots in the software, well-abstracted back-end implementations for several hardware and simulator platforms, and scalability of FI campaigns by providing massive parallelization. We describe FAIL∗, its application to the development process of safety-critical software, and the lessons learned from a real-world example.
AB - Due to voltage and structure shrinking, the influence of radiation on a circuit's operation increases, resulting in future hardware designs exhibiting much higher rates of soft errors. Software developers have to cope with these effects to ensure functional safety. However, software-based hardware fault tolerance is a holistic property that is tricky to achieve in practice, potentially impaired by every single design decision. We present FAIL∗, an open and versatile architecture-level fault-injection (FI) framework for the continuous assessment and quantification of fault tolerance in an iterative software development process. FAIL∗ supplies the developer with reusable and composable FI campaigns, advanced pre-and post-processing analyses to easily identify sensitive spots in the software, well-abstracted back-end implementations for several hardware and simulator platforms, and scalability of FI campaigns by providing massive parallelization. We describe FAIL∗, its application to the development process of safety-critical software, and the lessons learned from a real-world example.
KW - Continuous Fault-Resilience Assessment
KW - Error-Detection Measures
KW - Fault Resilience
KW - Fault-Injection Tool
KW - Hardware Fault Injection
KW - Post-Injection Analysis
KW - Quantification
KW - Sensitive Spot Analysis
KW - Software-Implemented Hardware Fault Tolerance
UR - http://www.scopus.com/inward/record.url?scp=84966393568&partnerID=8YFLogxK
U2 - 10.1109/edcc.2015.28
DO - 10.1109/edcc.2015.28
M3 - Conference contribution
AN - SCOPUS:84966393568
SP - 245
EP - 255
BT - 11th European Dependable Computing Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th European Dependable Computing Conference, EDCC 2015
Y2 - 7 September 2015 through 11 September 2015
ER -