Extension of the IEC 61000-4-20 Annex C to the Use of Arbitrary Transient Signals

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • Niklas Briest
  • David Hamann
  • Heyno Garbe
  • Stefan Potthast

Externe Organisationen

  • IAV GmbH
  • Wehrwissenschaftliches Institut Für Schutztechnologien - ABC-Schutz (WIS)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Aufsatznummer7888985
Seiten (von - bis)1276-1284
Seitenumfang9
FachzeitschriftIEEE Transactions on Electromagnetic Compatibility
Jahrgang59
Ausgabenummer4
Frühes Online-Datum29 März 2017
PublikationsstatusVeröffentlicht - 20 Apr. 2017

Abstract

Transverse electromagnetic (TEM) waveguides are predominantly used for emission and immunity tests. General requirements for TEM waveguides are given by the IEC 61000-4-20. Annex C of the IEC 61000-4-20 specifies immunity tests based on high-altitude electromagnetic pulses with a double exponential waveform. This waveform's shape is sufficiently defined by the rise time and the pulsewidth. The quality of its transmission within a waveguide can, thus, be expressed by the allowed variation of these parameters. However, other arbitrary signals cannot be reduced to just these characteristic parameters. In this paper, a method is described that offers the possibility to characterize the transmission quality of a TEM cell for arbitrary transient waveforms. It is based on the Pearson correlation coefficient of a so-called reference signal and the signals being measured within the test volume of a TEM cell. Both signals are measured simultaneously with identical field probes in order to be independent from the reproducibility of the signal generator. The signals are windowed and limited to include only the defining reflections and distortions. By means of this signal-dedicated validation procedure, the transmission quality of a TEM waveguide can be validated for an arbitrary transient waveform.

ASJC Scopus Sachgebiete

Zitieren

Extension of the IEC 61000-4-20 Annex C to the Use of Arbitrary Transient Signals. / Briest, Niklas; Hamann, David; Garbe, Heyno et al.
in: IEEE Transactions on Electromagnetic Compatibility, Jahrgang 59, Nr. 4, 7888985, 20.04.2017, S. 1276-1284.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Briest N, Hamann D, Garbe H, Potthast S. Extension of the IEC 61000-4-20 Annex C to the Use of Arbitrary Transient Signals. IEEE Transactions on Electromagnetic Compatibility. 2017 Apr 20;59(4):1276-1284. 7888985. Epub 2017 Mär 29. doi: 10.1109/TEMC.2017.2666880
Briest, Niklas ; Hamann, David ; Garbe, Heyno et al. / Extension of the IEC 61000-4-20 Annex C to the Use of Arbitrary Transient Signals. in: IEEE Transactions on Electromagnetic Compatibility. 2017 ; Jahrgang 59, Nr. 4. S. 1276-1284.
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abstract = "Transverse electromagnetic (TEM) waveguides are predominantly used for emission and immunity tests. General requirements for TEM waveguides are given by the IEC 61000-4-20. Annex C of the IEC 61000-4-20 specifies immunity tests based on high-altitude electromagnetic pulses with a double exponential waveform. This waveform's shape is sufficiently defined by the rise time and the pulsewidth. The quality of its transmission within a waveguide can, thus, be expressed by the allowed variation of these parameters. However, other arbitrary signals cannot be reduced to just these characteristic parameters. In this paper, a method is described that offers the possibility to characterize the transmission quality of a TEM cell for arbitrary transient waveforms. It is based on the Pearson correlation coefficient of a so-called reference signal and the signals being measured within the test volume of a TEM cell. Both signals are measured simultaneously with identical field probes in order to be independent from the reproducibility of the signal generator. The signals are windowed and limited to include only the defining reflections and distortions. By means of this signal-dedicated validation procedure, the transmission quality of a TEM waveguide can be validated for an arbitrary transient waveform.",
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AU - Garbe, Heyno

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N2 - Transverse electromagnetic (TEM) waveguides are predominantly used for emission and immunity tests. General requirements for TEM waveguides are given by the IEC 61000-4-20. Annex C of the IEC 61000-4-20 specifies immunity tests based on high-altitude electromagnetic pulses with a double exponential waveform. This waveform's shape is sufficiently defined by the rise time and the pulsewidth. The quality of its transmission within a waveguide can, thus, be expressed by the allowed variation of these parameters. However, other arbitrary signals cannot be reduced to just these characteristic parameters. In this paper, a method is described that offers the possibility to characterize the transmission quality of a TEM cell for arbitrary transient waveforms. It is based on the Pearson correlation coefficient of a so-called reference signal and the signals being measured within the test volume of a TEM cell. Both signals are measured simultaneously with identical field probes in order to be independent from the reproducibility of the signal generator. The signals are windowed and limited to include only the defining reflections and distortions. By means of this signal-dedicated validation procedure, the transmission quality of a TEM waveguide can be validated for an arbitrary transient waveform.

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