Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 2008 International Symposium on Electromagnetic Compatibility |
| Untertitel | EMC Europe |
| Publikationsstatus | Veröffentlicht - 2008 |
| Veranstaltung | 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, USA / Vereinigte Staaten Dauer: 18 Aug. 2008 → 22 Aug. 2008 |
Publikationsreihe
| Name | IEEE International Symposium on Electromagnetic Compatibility |
|---|---|
| ISSN (Print) | 1077-4076 |
Abstract
This document shows a new method for estimating the perturbation thresholds of electronic circuits while exposed by an electromagnetic field. The method is based on a simplified calculation of the coupled-in waveforms. It is compared to a former proposed estimation approach based on mathematical norms. Both investigated techniques are compared to measurements of real electronic systems.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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2008 International Symposium on Electromagnetic Compatibility: EMC Europe. 2008. (IEEE International Symposium on Electromagnetic Compatibility).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Evaluation of the Disturbing Potential of IEMI using Mathematical Norms and Analytical Calculations
AU - Korte, Sven
AU - Garbe, Heyno
PY - 2008
Y1 - 2008
N2 - This document shows a new method for estimating the perturbation thresholds of electronic circuits while exposed by an electromagnetic field. The method is based on a simplified calculation of the coupled-in waveforms. It is compared to a former proposed estimation approach based on mathematical norms. Both investigated techniques are compared to measurements of real electronic systems.
AB - This document shows a new method for estimating the perturbation thresholds of electronic circuits while exposed by an electromagnetic field. The method is based on a simplified calculation of the coupled-in waveforms. It is compared to a former proposed estimation approach based on mathematical norms. Both investigated techniques are compared to measurements of real electronic systems.
KW - Breakdown
KW - Coupling
KW - Electronic
KW - IEMI
KW - Intentional
KW - Transient
UR - http://www.scopus.com/inward/record.url?scp=63549119190&partnerID=8YFLogxK
U2 - 10.1109/EMCEUROPE.2008.4786915
DO - 10.1109/EMCEUROPE.2008.4786915
M3 - Conference contribution
AN - SCOPUS:63549119190
T3 - IEEE International Symposium on Electromagnetic Compatibility
BT - 2008 International Symposium on Electromagnetic Compatibility
T2 - 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008
Y2 - 18 August 2008 through 22 August 2008
ER -