Evaluation and design of a solid-state 193 nm OPO-Nd:YAG laser ablation system

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • Ingo Horn
  • Detlef Günther
  • Marcel Guillong

Organisationseinheiten

Externe Organisationen

  • ETH Zürich
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Seiten (von - bis)1837-1846
Seitenumfang10
FachzeitschriftSpectrochimica Acta - Part B Atomic Spectroscopy
Jahrgang58
Ausgabenummer10
PublikationsstatusVeröffentlicht - 17 Okt. 2003

Abstract

Today, most ablation systems operate at wavelengths in the UV region between 266 and 193 nm (experimental systems at 157 nm) to perform in-situ micro-analyses of solids in chemistry and earth sciences. The initially used solid-state laser technology of Nd:YAG laser ablation systems has been replaced in part by gas lasers such as excimer lasers operating in the deep UV region at 193 nm, which dominate the photolithography field in the semiconductor industry. Within this study an ablation system based on all-solid-state laser technology, operating at 193 nm, is described here along with its performance on high and low transparent materials. In order to describe the system to state-of-the-art instrumentation, results are compared with excimer data. However, the scope of the work is to describe alternative strategies to generate 193 nm.

ASJC Scopus Sachgebiete

Zitieren

Evaluation and design of a solid-state 193 nm OPO-Nd:YAG laser ablation system. / Horn, Ingo; Günther, Detlef; Guillong, Marcel.
in: Spectrochimica Acta - Part B Atomic Spectroscopy, Jahrgang 58, Nr. 10, 17.10.2003, S. 1837-1846.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Horn I, Günther D, Guillong M. Evaluation and design of a solid-state 193 nm OPO-Nd:YAG laser ablation system. Spectrochimica Acta - Part B Atomic Spectroscopy. 2003 Okt 17;58(10):1837-1846. doi: 10.1016/S0584-8547(03)00163-0
Horn, Ingo ; Günther, Detlef ; Guillong, Marcel. / Evaluation and design of a solid-state 193 nm OPO-Nd:YAG laser ablation system. in: Spectrochimica Acta - Part B Atomic Spectroscopy. 2003 ; Jahrgang 58, Nr. 10. S. 1837-1846.
Download
@article{e6c529bfa79e4f5488a7a3401222a454,
title = "Evaluation and design of a solid-state 193 nm OPO-Nd:YAG laser ablation system",
abstract = "Today, most ablation systems operate at wavelengths in the UV region between 266 and 193 nm (experimental systems at 157 nm) to perform in-situ micro-analyses of solids in chemistry and earth sciences. The initially used solid-state laser technology of Nd:YAG laser ablation systems has been replaced in part by gas lasers such as excimer lasers operating in the deep UV region at 193 nm, which dominate the photolithography field in the semiconductor industry. Within this study an ablation system based on all-solid-state laser technology, operating at 193 nm, is described here along with its performance on high and low transparent materials. In order to describe the system to state-of-the-art instrumentation, results are compared with excimer data. However, the scope of the work is to describe alternative strategies to generate 193 nm.",
keywords = "193 nm, Design, Eximer, Laser ablation, OPO-d:YAG",
author = "Ingo Horn and Detlef G{\"u}nther and Marcel Guillong",
note = "Funding Information: This project was funded by ETH Zurich. We thank Joy Reid for reviewing which helped to improve the manuscript and Hansr{\"u}di Kuhn for providing the excimer laser ablation data on brass B26. Support by CETAC Technologies is also acknowledged.",
year = "2003",
month = oct,
day = "17",
doi = "10.1016/S0584-8547(03)00163-0",
language = "English",
volume = "58",
pages = "1837--1846",
journal = "Spectrochimica Acta - Part B Atomic Spectroscopy",
issn = "0584-8547",
publisher = "Elsevier",
number = "10",

}

Download

TY - JOUR

T1 - Evaluation and design of a solid-state 193 nm OPO-Nd:YAG laser ablation system

AU - Horn, Ingo

AU - Günther, Detlef

AU - Guillong, Marcel

N1 - Funding Information: This project was funded by ETH Zurich. We thank Joy Reid for reviewing which helped to improve the manuscript and Hansrüdi Kuhn for providing the excimer laser ablation data on brass B26. Support by CETAC Technologies is also acknowledged.

PY - 2003/10/17

Y1 - 2003/10/17

N2 - Today, most ablation systems operate at wavelengths in the UV region between 266 and 193 nm (experimental systems at 157 nm) to perform in-situ micro-analyses of solids in chemistry and earth sciences. The initially used solid-state laser technology of Nd:YAG laser ablation systems has been replaced in part by gas lasers such as excimer lasers operating in the deep UV region at 193 nm, which dominate the photolithography field in the semiconductor industry. Within this study an ablation system based on all-solid-state laser technology, operating at 193 nm, is described here along with its performance on high and low transparent materials. In order to describe the system to state-of-the-art instrumentation, results are compared with excimer data. However, the scope of the work is to describe alternative strategies to generate 193 nm.

AB - Today, most ablation systems operate at wavelengths in the UV region between 266 and 193 nm (experimental systems at 157 nm) to perform in-situ micro-analyses of solids in chemistry and earth sciences. The initially used solid-state laser technology of Nd:YAG laser ablation systems has been replaced in part by gas lasers such as excimer lasers operating in the deep UV region at 193 nm, which dominate the photolithography field in the semiconductor industry. Within this study an ablation system based on all-solid-state laser technology, operating at 193 nm, is described here along with its performance on high and low transparent materials. In order to describe the system to state-of-the-art instrumentation, results are compared with excimer data. However, the scope of the work is to describe alternative strategies to generate 193 nm.

KW - 193 nm

KW - Design

KW - Eximer

KW - Laser ablation

KW - OPO-d:YAG

UR - http://www.scopus.com/inward/record.url?scp=0142061179&partnerID=8YFLogxK

U2 - 10.1016/S0584-8547(03)00163-0

DO - 10.1016/S0584-8547(03)00163-0

M3 - Article

AN - SCOPUS:0142061179

VL - 58

SP - 1837

EP - 1846

JO - Spectrochimica Acta - Part B Atomic Spectroscopy

JF - Spectrochimica Acta - Part B Atomic Spectroscopy

SN - 0584-8547

IS - 10

ER -