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Evaluating Consensus in Experimental K-ratios from over 40 WDS and EDS Measurement Systems

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Autorschaft

  • W. O. Nachlas
  • A. Moy
  • N. Ritchie
  • J. Donovan
  • R. Almeev

Organisationseinheiten

Externe Organisationen

  • University of Wisconsin
  • National Institute of Standards and Technology (NIST)
  • University of Oregon
  • ETH Zürich
  • Carnegie Institution of Washington
  • University of Nevada, Reno
  • University of Tasmania
  • Ruhr-Universität Bochum
  • Uniwersytet Warszawski
  • Smithsonian Institution
  • University of Alberta
  • University of British Columbia
  • University of Adelaide
  • University of Manitoba
  • CAS - Institute of Geology and Geophysics
  • General Electric Research
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Details

OriginalspracheEnglisch
Seiten (von - bis)225-226
Seitenumfang2
FachzeitschriftMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Jahrgang29
Ausgabenummer1
Frühes Online-Datum22 Juli 2023
PublikationsstatusVeröffentlicht - 1 Aug. 2023

ASJC Scopus Sachgebiete

Zitieren

Evaluating Consensus in Experimental K-ratios from over 40 WDS and EDS Measurement Systems. / Nachlas, W. O.; Moy, A.; Ritchie, N. et al.
in: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, Jahrgang 29, Nr. 1, 01.08.2023, S. 225-226.

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Nachlas, WO, Moy, A, Ritchie, N, Donovan, J, Fournelle, JH, Allaz, J, Almeev, R, Bullock, ES, DesOrmeau, JW, Goemann, K, Hoffmann, R, Jokubauskas, P, Jöns, N, Lam, T, Locock, A, Ruscitto, DM, Vicenzi, EP, von der Handt, A, Wade, B, Yang, P & Zhang, D 2023, 'Evaluating Consensus in Experimental K-ratios from over 40 WDS and EDS Measurement Systems', Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, Jg. 29, Nr. 1, S. 225-226. https://doi.org/10.1093/micmic/ozad067.100
Nachlas, W. O., Moy, A., Ritchie, N., Donovan, J., Fournelle, J. H., Allaz, J., Almeev, R., Bullock, E. S., DesOrmeau, J. W., Goemann, K., Hoffmann, R., Jokubauskas, P., Jöns, N., Lam, T., Locock, A., Ruscitto, D. M., Vicenzi, E. P., von der Handt, A., Wade, B., ... Zhang, D. (2023). Evaluating Consensus in Experimental K-ratios from over 40 WDS and EDS Measurement Systems. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29(1), 225-226. https://doi.org/10.1093/micmic/ozad067.100
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AU - Nachlas, W. O.

AU - Moy, A.

AU - Ritchie, N.

AU - Donovan, J.

AU - Fournelle, J. H.

AU - Allaz, J.

AU - Almeev, R.

AU - Bullock, E. S.

AU - DesOrmeau, J. W.

AU - Goemann, K.

AU - Hoffmann, R.

AU - Jokubauskas, P.

AU - Jöns, N.

AU - Lam, T.

AU - Locock, A.

AU - Ruscitto, D. M.

AU - Vicenzi, E. P.

AU - von der Handt, A.

AU - Wade, B.

AU - Yang, P.

AU - Zhang, D.

PY - 2023/8/1

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JO - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

JF - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

SN - 1431-9276

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ER -

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