Evaluating Consensus in Experimental K-ratios from over 40 WDS and EDS Measurement Systems

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • W. O. Nachlas
  • A. Moy
  • N. Ritchie
  • J. Donovan
  • J. H. Fournelle
  • J. Allaz
  • R. Almeev
  • E. S. Bullock
  • J. W. DesOrmeau
  • K. Goemann
  • R. Hoffmann
  • P. Jokubauskas
  • N. Jöns
  • T. Lam
  • A. Locock
  • D. M. Ruscitto
  • E. P. Vicenzi
  • A. von der Handt
  • B. Wade
  • P. Yang
  • D. Zhang

Organisationseinheiten

Externe Organisationen

  • University of Wisconsin
  • National Institute of Standards and Technology (NIST)
  • University of Oregon
  • ETH Zürich
  • Carnegie Institution of Washington
  • University of Nevada, Reno
  • University of Tasmania
  • Ruhr-Universität Bochum
  • Uniwersytet Warszawski
  • Smithsonian Institution
  • University of Alberta
  • University of British Columbia
  • University of Adelaide
  • University of Manitoba
  • CAS - Institute of Geology and Geophysics
  • General Electric Research
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Seiten (von - bis)225-226
Seitenumfang2
FachzeitschriftMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Jahrgang29
Ausgabenummer1
Frühes Online-Datum22 Juli 2023
PublikationsstatusVeröffentlicht - 1 Aug. 2023

ASJC Scopus Sachgebiete

Zitieren

Evaluating Consensus in Experimental K-ratios from over 40 WDS and EDS Measurement Systems. / Nachlas, W. O.; Moy, A.; Ritchie, N. et al.
in: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, Jahrgang 29, Nr. 1, 01.08.2023, S. 225-226.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Nachlas, WO, Moy, A, Ritchie, N, Donovan, J, Fournelle, JH, Allaz, J, Almeev, R, Bullock, ES, DesOrmeau, JW, Goemann, K, Hoffmann, R, Jokubauskas, P, Jöns, N, Lam, T, Locock, A, Ruscitto, DM, Vicenzi, EP, von der Handt, A, Wade, B, Yang, P & Zhang, D 2023, 'Evaluating Consensus in Experimental K-ratios from over 40 WDS and EDS Measurement Systems', Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, Jg. 29, Nr. 1, S. 225-226. https://doi.org/10.1093/micmic/ozad067.100
Nachlas, W. O., Moy, A., Ritchie, N., Donovan, J., Fournelle, J. H., Allaz, J., Almeev, R., Bullock, E. S., DesOrmeau, J. W., Goemann, K., Hoffmann, R., Jokubauskas, P., Jöns, N., Lam, T., Locock, A., Ruscitto, D. M., Vicenzi, E. P., von der Handt, A., Wade, B., ... Zhang, D. (2023). Evaluating Consensus in Experimental K-ratios from over 40 WDS and EDS Measurement Systems. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29(1), 225-226. https://doi.org/10.1093/micmic/ozad067.100
Download
@article{ba72b5eff25f48f886c5101cded0d491,
title = "Evaluating Consensus in Experimental K-ratios from over 40 WDS and EDS Measurement Systems",
author = "Nachlas, {W. O.} and A. Moy and N. Ritchie and J. Donovan and Fournelle, {J. H.} and J. Allaz and R. Almeev and Bullock, {E. S.} and DesOrmeau, {J. W.} and K. Goemann and R. Hoffmann and P. Jokubauskas and N. J{\"o}ns and T. Lam and A. Locock and Ruscitto, {D. M.} and Vicenzi, {E. P.} and {von der Handt}, A. and B. Wade and P. Yang and D. Zhang",
year = "2023",
month = aug,
day = "1",
doi = "10.1093/micmic/ozad067.100",
language = "English",
volume = "29",
pages = "225--226",
journal = "Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "1",

}

Download

TY - JOUR

T1 - Evaluating Consensus in Experimental K-ratios from over 40 WDS and EDS Measurement Systems

AU - Nachlas, W. O.

AU - Moy, A.

AU - Ritchie, N.

AU - Donovan, J.

AU - Fournelle, J. H.

AU - Allaz, J.

AU - Almeev, R.

AU - Bullock, E. S.

AU - DesOrmeau, J. W.

AU - Goemann, K.

AU - Hoffmann, R.

AU - Jokubauskas, P.

AU - Jöns, N.

AU - Lam, T.

AU - Locock, A.

AU - Ruscitto, D. M.

AU - Vicenzi, E. P.

AU - von der Handt, A.

AU - Wade, B.

AU - Yang, P.

AU - Zhang, D.

PY - 2023/8/1

Y1 - 2023/8/1

UR - http://www.scopus.com/inward/record.url?scp=85168627642&partnerID=8YFLogxK

U2 - 10.1093/micmic/ozad067.100

DO - 10.1093/micmic/ozad067.100

M3 - Article

C2 - 37613484

AN - SCOPUS:85168627642

VL - 29

SP - 225

EP - 226

JO - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

JF - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

SN - 1431-9276

IS - 1

ER -