Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 446 |
| Seitenumfang | 1 |
| Fachzeitschrift | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Jahrgang | 40 |
| Ausgabenummer | 1 |
| Publikationsstatus | Veröffentlicht - Jan. 2001 |
ASJC Scopus Sachgebiete
- Ingenieurwesen (insg.)
- Allgemeiner Maschinenbau
- Physik und Astronomie (insg.)
- Allgemeine Physik und Astronomie
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Erratum: Accurate method for the determination of bulk minority-carrier lifetimes of mono- and multicrystalline silicon wafers. / Schmidt, J.; Aberle, A. G.
in: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Jahrgang 40, Nr. 1, 01.2001, S. 446.
in: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Jahrgang 40, Nr. 1, 01.2001, S. 446.
Publikation: Beitrag in Fachzeitschrift › Meinungsbeitrag › Forschung › Peer-Review
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