Details
Originalsprache | Englisch |
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Titel des Sammelwerks | 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011 |
Seiten | 1359-1362 |
Seitenumfang | 4 |
Publikationsstatus | Veröffentlicht - 2011 |
Extern publiziert | Ja |
Veranstaltung | 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011 - Rio de Janeiro, Brasilien Dauer: 15 Mai 2011 → 18 Mai 2011 |
Publikationsreihe
Name | Proceedings - IEEE International Symposium on Circuits and Systems |
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ISSN (Print) | 0271-4310 |
Abstract
The charge pump belongs to the most critical blocks for electromagnetic compatibility (EMC) of low dropout linear regulators (LDO) because of its switching nature. The goal of this paper is to contribute charge pump design practice and a prediction method for the LDO EMC performance already in an early design phase. LDO noise coupling mechanisms are analyzed. EMC aware circuit design includes the choice of low noise architectures, the right switching frequency and noise filtering. The derived simulation method shows very good matching with EMC test results for an LDO with two different charge pumps fabricated in 350nm high-voltage BiCMOS technology. For a realistic prediction of the EMC noise magnitude, a relatively simple simulation setup gives results with #60;3dBV accuracy. A trippler current mode charge pump turned out to be well suitable for EMC. Conducted emissions could be predicted and confirmed to be improved by 50dBV versus a conventional voltage mode charge pump.
ASJC Scopus Sachgebiete
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011. 2011. S. 1359-1362 5937824 (Proceedings - IEEE International Symposium on Circuits and Systems).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - EMC influence of the charge pump in linear regulators - Design, simulation and measurements
AU - Wittmann, Juergen
AU - Wicht, Bernhard
N1 - Copyright: Copyright 2011 Elsevier B.V., All rights reserved.
PY - 2011
Y1 - 2011
N2 - The charge pump belongs to the most critical blocks for electromagnetic compatibility (EMC) of low dropout linear regulators (LDO) because of its switching nature. The goal of this paper is to contribute charge pump design practice and a prediction method for the LDO EMC performance already in an early design phase. LDO noise coupling mechanisms are analyzed. EMC aware circuit design includes the choice of low noise architectures, the right switching frequency and noise filtering. The derived simulation method shows very good matching with EMC test results for an LDO with two different charge pumps fabricated in 350nm high-voltage BiCMOS technology. For a realistic prediction of the EMC noise magnitude, a relatively simple simulation setup gives results with #60;3dBV accuracy. A trippler current mode charge pump turned out to be well suitable for EMC. Conducted emissions could be predicted and confirmed to be improved by 50dBV versus a conventional voltage mode charge pump.
AB - The charge pump belongs to the most critical blocks for electromagnetic compatibility (EMC) of low dropout linear regulators (LDO) because of its switching nature. The goal of this paper is to contribute charge pump design practice and a prediction method for the LDO EMC performance already in an early design phase. LDO noise coupling mechanisms are analyzed. EMC aware circuit design includes the choice of low noise architectures, the right switching frequency and noise filtering. The derived simulation method shows very good matching with EMC test results for an LDO with two different charge pumps fabricated in 350nm high-voltage BiCMOS technology. For a realistic prediction of the EMC noise magnitude, a relatively simple simulation setup gives results with #60;3dBV accuracy. A trippler current mode charge pump turned out to be well suitable for EMC. Conducted emissions could be predicted and confirmed to be improved by 50dBV versus a conventional voltage mode charge pump.
UR - http://www.scopus.com/inward/record.url?scp=79960867622&partnerID=8YFLogxK
U2 - 10.1109/ISCAS.2011.5937824
DO - 10.1109/ISCAS.2011.5937824
M3 - Conference contribution
AN - SCOPUS:79960867622
SN - 9781424494736
T3 - Proceedings - IEEE International Symposium on Circuits and Systems
SP - 1359
EP - 1362
BT - 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011
T2 - 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011
Y2 - 15 May 2011 through 18 May 2011
ER -