Details
| Originalsprache | Englisch |
|---|---|
| Aufsatznummer | 084002 |
| Fachzeitschrift | Journal of Physics Condensed Matter |
| Jahrgang | 30 |
| Ausgabenummer | 8 |
| Publikationsstatus | Veröffentlicht - 31 Jan. 2018 |
Abstract
Electromigration (EM) as a structuring tool was investigated in Ag nanowires (width 300 nm, thickness 25 nm) and partly in notched and bow-tie Ag structures on a Si(1 0 0) substrate in ultra-high vacuum using a four-tip scanning tunneling microscope in combination with a scanning electron microscope. From simulations of Ag nanowires we got estimates of temperature profiles, current density profiles, EM and thermal migration (TM) mass flux distributions within the nanowire induced by critical current densities of 108 A cm-2. At room temperature, the electron wind force at these current densities by far dominates over thermal diffusion, and is responsible for formation of voids at the cathode and hillocks at the anode side. For current densities that exceed the critical current densities necessary for EM, a new type of wire-like structure formation was found both at room temperature and at 100 K for notched and bow-tie structures. This suggests that the simultaneous action of EM and TM is structure forming, but with a very small influence of TM at low temperature.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Allgemeine Materialwissenschaften
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
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in: Journal of Physics Condensed Matter, Jahrgang 30, Nr. 8, 084002, 31.01.2018.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Electromigration and morphological changes in Ag nanostructures
AU - Chatterjee, Atasi
AU - Bai, Tianjin
AU - Edler, Frederik
AU - Tegenkamp, Christoph
AU - Weide-Zaage, Kirsten
AU - Pfnür, Herbert
N1 - Funding information: The authors acknowledge Detlef Zech, MBE, Leibniz University Hannover, for technical assistance and the financial support from the Hannover School for Nanotechnology (HSN).
PY - 2018/1/31
Y1 - 2018/1/31
N2 - Electromigration (EM) as a structuring tool was investigated in Ag nanowires (width 300 nm, thickness 25 nm) and partly in notched and bow-tie Ag structures on a Si(1 0 0) substrate in ultra-high vacuum using a four-tip scanning tunneling microscope in combination with a scanning electron microscope. From simulations of Ag nanowires we got estimates of temperature profiles, current density profiles, EM and thermal migration (TM) mass flux distributions within the nanowire induced by critical current densities of 108 A cm-2. At room temperature, the electron wind force at these current densities by far dominates over thermal diffusion, and is responsible for formation of voids at the cathode and hillocks at the anode side. For current densities that exceed the critical current densities necessary for EM, a new type of wire-like structure formation was found both at room temperature and at 100 K for notched and bow-tie structures. This suggests that the simultaneous action of EM and TM is structure forming, but with a very small influence of TM at low temperature.
AB - Electromigration (EM) as a structuring tool was investigated in Ag nanowires (width 300 nm, thickness 25 nm) and partly in notched and bow-tie Ag structures on a Si(1 0 0) substrate in ultra-high vacuum using a four-tip scanning tunneling microscope in combination with a scanning electron microscope. From simulations of Ag nanowires we got estimates of temperature profiles, current density profiles, EM and thermal migration (TM) mass flux distributions within the nanowire induced by critical current densities of 108 A cm-2. At room temperature, the electron wind force at these current densities by far dominates over thermal diffusion, and is responsible for formation of voids at the cathode and hillocks at the anode side. For current densities that exceed the critical current densities necessary for EM, a new type of wire-like structure formation was found both at room temperature and at 100 K for notched and bow-tie structures. This suggests that the simultaneous action of EM and TM is structure forming, but with a very small influence of TM at low temperature.
KW - electromigration
KW - metallic nanostructures
KW - multiprobe techniques
KW - structure formation
UR - http://www.scopus.com/inward/record.url?scp=85041901569&partnerID=8YFLogxK
U2 - 10.1088/1361-648x/aaa80a
DO - 10.1088/1361-648x/aaa80a
M3 - Article
C2 - 29336347
AN - SCOPUS:85041901569
VL - 30
JO - Journal of Physics Condensed Matter
JF - Journal of Physics Condensed Matter
SN - 0953-8984
IS - 8
M1 - 084002
ER -