Effects of Shielding Enclosures on the Breakdown Failure Rate of Electronic Equipment

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • Helge Herlemann
  • Sven Fisahn
  • Michael Koch
  • Heyno Garbe
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Details

OriginalspracheEnglisch
Titel des Sammelwerks2008 International Symposium on Electromagnetic Compatibility
UntertitelEMC Europe
PublikationsstatusVeröffentlicht - 2008
Veranstaltung2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, USA / Vereinigte Staaten
Dauer: 18 Aug. 200822 Aug. 2008

Publikationsreihe

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076

Abstract

As a criterion of quality of a shield regarding its ability to protect electronic equipment against electromagnetic pulses, the breakdown failure rate of an operating test equipment with and without the shield can be compared [1]. In this contribution, the shielding behavior of cubical shields with varying rectangular slots against ultra wideband pulses of double exponential wave form is studied. It is found out, that applying the shield may have the effect, that electronic equipment becomes even more vulnerable to pulses due to resonance effects inside the enclosure. The results of these examinations in time domain are compared to results in frequency domain which can be found in literature [2].

ASJC Scopus Sachgebiete

Zitieren

Effects of Shielding Enclosures on the Breakdown Failure Rate of Electronic Equipment. / Herlemann, Helge; Fisahn, Sven; Koch, Michael et al.
2008 International Symposium on Electromagnetic Compatibility: EMC Europe. 2008. (IEEE International Symposium on Electromagnetic Compatibility).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Herlemann, H, Fisahn, S, Koch, M & Garbe, H 2008, Effects of Shielding Enclosures on the Breakdown Failure Rate of Electronic Equipment. in 2008 International Symposium on Electromagnetic Compatibility: EMC Europe. IEEE International Symposium on Electromagnetic Compatibility, 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008, Detroit, Michigan, USA / Vereinigte Staaten, 18 Aug. 2008. https://doi.org/10.1109/EMCEUROPE.2008.4786905
Herlemann, H., Fisahn, S., Koch, M., & Garbe, H. (2008). Effects of Shielding Enclosures on the Breakdown Failure Rate of Electronic Equipment. In 2008 International Symposium on Electromagnetic Compatibility: EMC Europe (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/EMCEUROPE.2008.4786905
Herlemann H, Fisahn S, Koch M, Garbe H. Effects of Shielding Enclosures on the Breakdown Failure Rate of Electronic Equipment. in 2008 International Symposium on Electromagnetic Compatibility: EMC Europe. 2008. (IEEE International Symposium on Electromagnetic Compatibility). doi: 10.1109/EMCEUROPE.2008.4786905
Herlemann, Helge ; Fisahn, Sven ; Koch, Michael et al. / Effects of Shielding Enclosures on the Breakdown Failure Rate of Electronic Equipment. 2008 International Symposium on Electromagnetic Compatibility: EMC Europe. 2008. (IEEE International Symposium on Electromagnetic Compatibility).
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