Do we have enough data? Robust reliability via uncertainty quantification

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • Roberto Rocchetta
  • Matteo Broggi
  • Edoardo Patelli

Externe Organisationen

  • The University of Liverpool
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Seiten (von - bis)710-721
Seitenumfang12
FachzeitschriftApplied Mathematical Modelling
Jahrgang54
Frühes Online-Datum26 Okt. 2017
PublikationsstatusVeröffentlicht - Feb. 2018

Abstract

A generalised probabilistic framework is proposed for reliability assessment and uncertainty quantification under a lack of data. The developed computational tool allows the effect of epistemic uncertainty to be quantified and has been applied to assess the reliability of an electronic circuit and a power transmission network. The strength and weakness of the proposed approach are illustrated by comparison to traditional probabilistic approaches. In the presence of both aleatory and epistemic uncertainty, classic probabilistic approaches may lead to misleading conclusions and a false sense of confidence which may not fully represent the quality of the available information. In contrast, generalised probabilistic approaches are versatile and powerful when linked to a computational tool that permits their applicability to realistic engineering problems.

ASJC Scopus Sachgebiete

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Do we have enough data? Robust reliability via uncertainty quantification. / Rocchetta, Roberto; Broggi, Matteo; Patelli, Edoardo.
in: Applied Mathematical Modelling, Jahrgang 54, 02.2018, S. 710-721.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Rocchetta R, Broggi M, Patelli E. Do we have enough data? Robust reliability via uncertainty quantification. Applied Mathematical Modelling. 2018 Feb;54:710-721. Epub 2017 Okt 26. doi: 10.15488/10761, 10.1016/j.apm.2017.10.020
Rocchetta, Roberto ; Broggi, Matteo ; Patelli, Edoardo. / Do we have enough data? Robust reliability via uncertainty quantification. in: Applied Mathematical Modelling. 2018 ; Jahrgang 54. S. 710-721.
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@article{e3b9877ee95a408b90d03552826a798f,
title = "Do we have enough data?: Robust reliability via uncertainty quantification",
abstract = "A generalised probabilistic framework is proposed for reliability assessment and uncertainty quantification under a lack of data. The developed computational tool allows the effect of epistemic uncertainty to be quantified and has been applied to assess the reliability of an electronic circuit and a power transmission network. The strength and weakness of the proposed approach are illustrated by comparison to traditional probabilistic approaches. In the presence of both aleatory and epistemic uncertainty, classic probabilistic approaches may lead to misleading conclusions and a false sense of confidence which may not fully represent the quality of the available information. In contrast, generalised probabilistic approaches are versatile and powerful when linked to a computational tool that permits their applicability to realistic engineering problems.",
keywords = "Computational tool, Dempster–Shafer, Information quality, Probability boxes, Reliability, Uncertainty quantification",
author = "Roberto Rocchetta and Matteo Broggi and Edoardo Patelli",
note = "Publisher Copyright: {\textcopyright} 2017 Elsevier Inc. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.",
year = "2018",
month = feb,
doi = "10.15488/10761",
language = "English",
volume = "54",
pages = "710--721",
journal = "Applied Mathematical Modelling",
issn = "0307-904X",
publisher = "Elsevier Inc.",

}

Download

TY - JOUR

T1 - Do we have enough data?

T2 - Robust reliability via uncertainty quantification

AU - Rocchetta, Roberto

AU - Broggi, Matteo

AU - Patelli, Edoardo

N1 - Publisher Copyright: © 2017 Elsevier Inc. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.

PY - 2018/2

Y1 - 2018/2

N2 - A generalised probabilistic framework is proposed for reliability assessment and uncertainty quantification under a lack of data. The developed computational tool allows the effect of epistemic uncertainty to be quantified and has been applied to assess the reliability of an electronic circuit and a power transmission network. The strength and weakness of the proposed approach are illustrated by comparison to traditional probabilistic approaches. In the presence of both aleatory and epistemic uncertainty, classic probabilistic approaches may lead to misleading conclusions and a false sense of confidence which may not fully represent the quality of the available information. In contrast, generalised probabilistic approaches are versatile and powerful when linked to a computational tool that permits their applicability to realistic engineering problems.

AB - A generalised probabilistic framework is proposed for reliability assessment and uncertainty quantification under a lack of data. The developed computational tool allows the effect of epistemic uncertainty to be quantified and has been applied to assess the reliability of an electronic circuit and a power transmission network. The strength and weakness of the proposed approach are illustrated by comparison to traditional probabilistic approaches. In the presence of both aleatory and epistemic uncertainty, classic probabilistic approaches may lead to misleading conclusions and a false sense of confidence which may not fully represent the quality of the available information. In contrast, generalised probabilistic approaches are versatile and powerful when linked to a computational tool that permits their applicability to realistic engineering problems.

KW - Computational tool

KW - Dempster–Shafer

KW - Information quality

KW - Probability boxes

KW - Reliability

KW - Uncertainty quantification

UR - http://www.scopus.com/inward/record.url?scp=85037809995&partnerID=8YFLogxK

U2 - 10.15488/10761

DO - 10.15488/10761

M3 - Article

AN - SCOPUS:85037809995

VL - 54

SP - 710

EP - 721

JO - Applied Mathematical Modelling

JF - Applied Mathematical Modelling

SN - 0307-904X

ER -